Oversampled image sensor with conditional pixel readout

ABSTRACT

In a pixel array within an integrated-circuit image sensor, each of a plurality of pixels is evaluated to determine whether charge integrated within the pixel in response to incident light exceeds a first threshold. N-bit digital samples corresponding to the charge integrated within at least a subset of the plurality of pixels are generated, and then applied to a lookup table to retrieve respective M-bit digital values (M being less than N), wherein a stepwise range of charge integration levels represented by possible states of the M-bit digital values extends upward from a starting charge integration level that is determined based on the first threshold.

CROSS REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. patent application Ser. No.15/333,645 filed Oct. 25, 2016, ( now U.S. Pat. No. 9,681,071), which isa continuation of U.S. patent application Ser. No. 14/638,161 filed Mar.4, 2015 (now U.S. Pat. No. 9,491,391), which is a continuation of U.S.patent application Ser. No. 14/482,065 filed Sep. 10, 2014 (now U.S.Pat. No. 9,001,251),” which claims priority to U.S. Provisional PatentApplication No. 61/875,882 filed Sep. 10, 2013. Each of theabove-identified patent applications is hereby incorporated byreference.

TECHNICAL FIELD

The present disclosure relates to the field of electronic image sensors,and more specifically to a sampling architecture for use in such imagesensors.

BACKGROUND

Digital image sensors, such as CMOS or CCD sensors, include a pluralityof photosensitive elements (“photosensors”) each configured to convertphotons incident upon the photosensors (“captured light” or “collectedlight”) into electric charge. The electric charge can then be convertedinto image data representing the light captured by each photosensor. Theimage data includes a digital representation of the captured light, andmay be manipulated or processed to produce a digital image capable ofdisplay on a viewing device. Image sensors are implemented in integratedcircuits (“ICs”) with a physical surface that may be divided into aplurality of pixel regions (for instance, one or more photosensors andattendant control circuitry) configured to convert light into anelectrical signal (charge, voltage, current, etc.). For convenience,pixel regions within an image sensor may also be referred to as imagepixels (“IPs”) and the aggregate of the pixel regions or image pixelswill be referred to as the image sensor region. An image sensor ICtypically will also include areas outside of the image sensor region,for example certain types of control, sampling, or interface circuitry.Most CMOS image sensors contain A/D (analog-to-digital) circuitry toconvert pixel electrical signals into digital image data. The A/Dcircuitry can be one or more ADCs (analog-to-digital converters) locatedwithin or at the periphery of the image sensor region.

BRIEF DESCRIPTION OF THE DRAWINGS

The various embodiments disclosed herein are illustrated by way ofexample, and not by way of limitation, in the figures of theaccompanying drawings and in which like reference numerals refer tosimilar elements and in which:

FIG. 1 illustrates a cross-section of a portion of an image sensor,according to one embodiment;

FIG. 2 illustrates partial array circuitry of an analog pixel imagesensor with multiple pixel signal thresholds, according to oneembodiment useful, e.g., in the layout of FIG. 1;

FIG. 3 illustrates an example image sensor read circuit configured toconvert a pixel signal into a multi-bit digital conversion, according toone embodiment useful, e.g., with the embodiments of FIGS. 1 and 2;

FIG. 4 illustrates an example circuit block diagram embodiment of animage sensor system with a multi-bit architecture, according to oneembodiment using, e.g., the cross-section of FIG. 1 and the circuitry ofFIGS. 2 and 3;

FIG. 5 illustrates another example circuit block diagram of an imagesensor system architecture with read circuit arrays located peripherallyto an IP array, according to one embodiment using, e.g., thecross-section of FIG. 1 and the circuitry of FIGS. 2 and 3;

FIG. 6a illustrates a top view of a pixel array IC in an exampletwo-layer image sensor system architecture alternative to FIGS. 4 and 5,according to one embodiment using, e.g., the array circuitry of FIG. 2;

FIG. 6b illustrates a top view of a preprocessor IC in an exampletwo-layer image sensor system architecture alternative to FIGS. 4 and 5,according to one embodiment using, e.g., the read circuitry of FIG. 3;

FIG. 6c illustrates a partial cross section of the pixel array IC ofFIG. 6a and the preprocessor IC of FIG. 6b in an example two-layer imagesensor system architecture, according to one embodiment;

FIG. 7 illustrates the operation of an image sensor read circuit, suchas the read circuit of FIG. 3, according to one embodiment;

FIG. 8 illustrates data flow in an image capture system, according toone embodiment useful with the systems described herein;

FIG. 9 illustrates various temporal sampling policies for use by animage sensor read circuit, such as the read circuit of FIG. 3, accordingto one embodiment;

FIG. 10 illustrates an embodiment of a modified 4-transistor pixel inwhich a non-destructive overthreshold detection operation is executed toenable conditional-reset operation in conjunction with correlated doublesampling;

FIG. 11 is a timing diagram illustrating an exemplary pixel cycle withinthe progressive read-out pixel of FIG. 10;

FIGS. 12 and 13 illustrate exemplary electrostatic potential diagramsfor the photodiode, transfer gate and floating diffusion of FIG. 10below their corresponding schematic cross-section diagrams;

FIG. 14 illustrates an embodiment of an image sensor 300 having aprogressive-readout pixel array;

FIGS. 15A-15C illustrate alternative column read-out circuit embodimentsthat may be employed in connection with the progressive read-out pixelsdescribed in reference to FIGS. 10-14;

FIG. 16 illustrates a quad-pixel, shared floating diffusion image sensorarchitecture in which the row and column transfer-gate control linesdisclosed in the embodiments of FIGS. 10-14 may be applied in a mannerthat enables multiple decimation modes without requiring additionalarray-traversing control lines;

FIG. 17 illustrates an exemplary physical layout of the quad-pixelarchitecture shown in FIG. 16;

FIGS. 18A and 18B illustrate color filter array (CFA) patterns that maybe employed with respect to the quad-pixel architecture of FIGS. 16 and17;

FIGS. 19 and 20 present timing diagrams illustrating exemplary phases offull-resolution (non-binning) and binned-mode pixel read-out operations,respectively, within an image sensor containing the 2×2 quad-pixelarrangement shown in FIG. 16;

FIG. 21 illustrates an alternative binning strategy that may be executedwith respect a collection of 4×1 quad-pixel blocks in conjunction with acolor filter array;

FIG. 22 illustrates a column-interconnect architecture that may beapplied to enable voltage-binning of analog signals read-out fromselected columns of 4×1 quad-pixel blocks;

FIG. 23 illustrates an exemplary timing diagram of binned-mode read-outoperations within the 4×1 quad-pixel architecture of FIGS. 21 and 22;

FIG. 24 illustrates a more detailed embodiment of an image sensor havingan array of 4×1 quad pixel blocks operable in the decimation (binning)mode described in reference to FIGS. 21-23;

FIGS. 25A-25C illustrate an embodiment of a selectable-gain (ormulti-gain) read-out circuit that may be used to effect a high-gainpartial read-out and near-unity gain full read-out within a pixelcolumn;

FIG. 26 presents an exemplary timing diagram illustrating thealternating application of common-source and source-follower gainconfigurations during hard-reset, integration, partial read-out and(conditional) full read-out operations within the multi-gainarchitecture of FIG. 25A;

FIG. 27 illustrates an alternative embodiment of a selectable-gain (ormulti-gain) read-out circuit that may be used to effect a high-gainpartial read-out and near-unity gain full read-out within a pixelcolumn;

FIG. 28 illustrates an embodiment of an image sensor having a pixelarray disposed between upper and lower read-out circuits;

FIG. 29 illustrates an embodiment of an imaging system having aconditional-reset image sensor together with an image processor, memoryand display;

FIG. 30 illustrates an exemplary sequence of operations that may beexecuted within the imaging system of FIG. 29 in connection with animage processing operation;

FIG. 31 contrasts embodiments of the conditional-reset pixel of FIG. 10and a “split-gate” pixel;

FIG. 32 is a timing diagram illustrating an exemplary pixel cycle(reset/charge integration/read-out) within the split-gate pixel of FIG.31;

FIG. 33 illustrates exemplary low-light and high-light operation of thesplit-gate pixel of FIG. 31, showing electrostatic potential diagrams ineach case beneath schematic cross-section diagrams of the photodetector,dual-control transfer gate and floating diffusion;

FIG. 34 illustrates an alternative overthreshold detection operationwithin the split-gate pixel of FIG. 31;

FIG. 35 illustrates an exemplary implementation of the dual-control gateshown in FIG. 31;

FIG. 36 illustrates an alternative manner of implementing thedual-control gate structure of FIG. 31;

FIG. 37 illustrates a quad-pixel, shared floating diffusion image sensorarchitecture in which pairs of row and column transfer-gate controllines are coupled to a dual-gate structure within each of foursplit-gate pixels;

FIGS. 38 and 39 illustrate exemplary physical layouts of the quad-pixelof FIG. 37, showing the four photodiodes disposed about and switchablycoupled to a centralized floating diffusion via respective dual-controlgate structures;

FIGS. 40 and 41 illustrate a split-gate pixel architecture andcorresponding timing diagram according to an alternative embodiment thatlacks a dedicated row transfer-gate (TGr) line;

FIG. 42A illustrates an alternative dual-control gate arrangement inwhich the gate elements of a dual-control gate are formed by respectivep-doped and n-doped regions of a diode;

FIG. 42B illustrates another alternative dual-control gate arrangementin which the gate elements of a dual-control gate are formed byrespective p-doped regions of back-to-back diodes having a sharedn-doped region;

FIG. 43 illustrates a 4×1 block of split-pixels (a quad, split-pixelblock) that may be operated in binned or independent-pixel modes asdescribed above, for example, in reference to FIG. 21;

FIG. 44 illustrates an imaging system architecture in which the datatransfer bandwidth required between an image sensor and image processoris reduced using a visually lossless lookup table (VLL);

FIG. 45 illustrates an exemplary compression function that may beapplied within the VLL of FIG. 44 to convert an N-bit input to an M-bitoutput, where M is less than N.

FIG. 46 illustrates an exemplary threshold referenced VLL transform;

FIG. 47 illustrates embodiments of a line memory and VLL logic circuitthat may be used to implement the line memory and VLL logic shown inFIG. 44;

FIG. 48 depicts an exemplary output table showing an exemplaryinterpretation of ADC and VLL outputs for the various states of flagbits recorded within line memory;

FIG. 49 illustrates an exemplary sequence of four subframes thatconstitute an image frame interval (exposure interval) within the imagesensor of FIG. 44;

FIG. 50 illustrates an exemplary per-lane VLL logic component capable ofapplying subframe-specific threshold-referenced VLLs as shown in FIG.49, and that may be employed to realize the individual per-lane VLLlogic circuits depicted in FIG. 47;

FIG. 51 depicts an exemplary serializer output as a sequence of samples,with eight-bit samples being transmitted back-to-back in an 8-bitbit-depth mode, and 7-bit samples being transmitted back-to-back in a7-bit bit-depth mode;

FIG. 52 illustrates an embodiment of a low power image sensor that maybe used to implement component circuitry within the image sensor of FIG.44

FIG. 53 illustrates a sequence of operations that may be executed withinthe pixel array, sample/hold banks and comparator circuitry of FIG. 52to carry out pixel state assessment and enable subsequent ADC operationfor row after row of pixels;

FIG. 54A illustrates an exemplary timing diagram in accordance with thesensor architecture of FIG. 52 and operational sequence of FIG. 53,including alternate TGc waveforms corresponding to split-gate andcontinuous-gate pixel array embodiments, respectively;

FIGS. 54B and 54C present exemplary read-out sequences that may beemployed with respect to even and odd rows of pixels.

FIG. 55 illustrates an embodiment of multi-bank sample-and-hold circuitthat may be used to implement the sample-and-hold (S/H) circuitrydepicted in FIG. 53;

FIG. 56 illustrates an exemplary sample and hold pipeline correspondinggenerally to the S/H bank usage intervals within the timing arrangementof FIG. 54;

FIG. 57 illustrates embodiments of a reference multiplexer, comparatorinput multiplexer and comparator that may be used to implementlike-named components depicted in FIG. 52;

FIG. 58 illustrates embodiments of a column-shared programmable gainamplifier and K:1 ADC input multiplexer that may be deployed within theembodiment of FIG. 52.

FIG. 59A illustrates embodiments of a read-enable multiplexer,ADC-enable logic and ADC circuit that may be used to implement the K:1read-enable multiplexer and ADC circuitry of FIG. 52;

FIG. 59B illustrates a convert signal timing diagram corresponding toFIG. 59A;

FIG. 60 illustrates an example of a 2×2 read kernel that may be effectedthrough read dilation, with the four pixels shown disposed beneath colorfilter elements disposed in a Bayer pattern, including a red element(R), blue element (B) and two green elements (Gr and Gb);

FIG. 61 illustrates an exemplary read dilation flow diagram with respectto a read kernel, assuming for purposes of explanation that neighboringread kernels do not overlap;

FIGS. 62A and 62B illustrate an exemplary set of 2×2 read kernels andcorresponding read-dilation flow diagram in an embodiment in which thebottom row of each read kernel overlaps the top row of the read kernelbelow;

FIGS. 63A and 63B illustrate an exemplary set of 2×2 read kernels andcorresponding read-dilation flow diagram within an image sensorembodiment in which the bottom row of each read kernel overlaps the toprow of the read kernel below, but having 2×2 shared-readout pixel blocksinstead of the 1×4 shared-readout pixel blocks assumed in FIGS. 62A and62B; and

FIG. 64 illustrates an exemplary K-column section of an image sensorhaving logic to carry out read-dilation operations as illustrated inFIGS. 62A/62B and 63A/63B.

DETAILED DESCRIPTION

In some image sensors, electrical information representing a photonresponse and resulting from light incident upon a pixel region (referredto herein as a “pixel signal”) is converted to a digital image datavalue by read circuitry. The read circuitry can reside within the imagesensor, or can be located external to the image sensor. In someapproaches, a read circuit can be located within the image sensor foruse by one or more pixel regions adjacent or near the read circuit. Forread circuits located external to the image sensor, the pixel signals ofone or more pixel regions associated with the read circuits can betransferred from the pixel regions to the read circuits.

Each read circuit samples a pixel region, receives a pixel signal fromthe sampled pixel region, and converts the pixel signal to a multi-bitdigital value representative of the pixel signal. In the event that apixel signal or a digital value representative of the pixel signalexceeds a sampling threshold, the pixel signal stored at the pixelregion associated with the pixel signal is reset (for instance, byresetting a photosensitive element associated with the pixel region). Ifthe pixel signal or the digital value do not exceed the samplingthreshold, the pixel signal stored at the pixel region is not reset. Thesampling of a pixel region and the resetting of a pixel signal at thepixel region only when the pixel signal exceeds a sampling threshold isreferred to herein as “non-destructive sampling with conditional reset.”

Image Sensor Overview

FIG. 1 illustrates a partial cross-section of an image sensor 25 usefulin an embodiment. In image sensor 25, light passing through a microlensarray 10 and a color filter array 12 (useful for color imaging) isincident upon a silicon section 20 of the image sensor. The use ofmicrolenses (or other concentrating optics) and color filters isoptional and is shown here for illustrative purposes only. Silicon 20contains photodiodes (not shown) to collect charge generated by photonsabsorbed by the silicon, and access transistors (also not shown) tooperate the photodiodes. Pixel array IC wiring 14 provides connectionsused to route signals and supply voltages within the array. As shown,image sensor 25 is a BackSide Illuminated (BSI) sensor because lightenters the silicon from the side of the integrated circuit opposite thewiring layers and primary active circuit formation. Optionally, pixelarray IC wiring 14 can be arranged between the color filter array 12 andsilicon 20 (with primary active circuit formation within the “top” ofthe silicon as oriented in FIG. 1) for FrontSide Illumination (FSI).

The image sensor 25 includes a plurality of IPs (“image pixels”),IP1-IP3 shown, upon which light collected by the lenses of the microlensarray 10 is respectively incident. Each IP includes one or morephotodiodes embedded within the silicon 20. At least some photonsentering silicon 20 are converted to electron-hole pairs in the siliconand the resulting electrons (or holes in alternate embodiments) arecollected by the IPs. The description herein will refer to this processas the capture and conversion of light by the IPs into image data forthe purposes of simplicity. Each IP of the image sensor represents aportion of the surface area of the image sensor, and the IPs of theimage sensor may be organized into various arrays of columns and rows.In a CMOS or CCD image pixel technology, each IP (for instance, eachphotosensor) converts light incident upon the IP into a charge andincludes readout circuitry configured to convert the charge into avoltage or current. In one embodiment, the light captured by each IP ofthe image sensor represents one pixel of image data for an associateddigital image, though in other embodiments image data from multiple IPsis combined to represent a fewer number (one or more) of pixels(downscaling).

The image sensor 25 may include components outside the IP array.Similarly, portions of the IP array may include components that do notconvert light into charge. The region defined by the IPs in theaggregate will be referred to as the image sensor region. As describedherein, the image sensor may include amplifiers, analog-to-digitalconverters (“ADCs”), comparators, controllers, counters, accumulators,registers, transistors, photodiodes, and the like. In differentarchitectures, some of these components may be located within the imagesensor region or external to the image sensor region, and somecomponents may be located on a companion integrated circuit. In theseembodiments, a lens (such as those of the microlens array 10) may beconfigured to direct light toward the actual light-sensing elementswithin the IP rather than, for example, on the amplifiers, comparators,controllers, and other components.

As noted above, an image sensor may include an array of multiple IPs.Each IP, in response to light (for instance, one or more photons),captures and stores a corresponding charge. In one embodiment, uponsampling an IP, if a pixel signal representative of the charge stored atthe IP exceeds a sampling threshold, the pixel signal is converted to adigital value representing the pixel signal and the charge stored by theIP is reset. Alternatively, upon sampling an IP, a pixel signalrepresentative of the charge stored at the IP is converted to a digitalvalue representative of the pixel signal, and if the digital valueexceeds a sampling threshold, the charge stored by the IP is reset. Inother embodiments, an analog-to-digital conversion is begun, and whenenough of the conversion has been completed to determine whether thethreshold is exceeded, a determination is made as to whether to continuethe conversion. For instance, in a successive approximation register(“SAR”) ADC, if the threshold is equal to a most-significant-bit(s)pattern, as soon as the pattern is resolved a determination can be madeas to whether to continue the conversion and perform a reset of thepixel, or stop the conversion. A determination of whether a pixel signalor a digital value representative of a pixel signal exceeds a samplingthreshold can be made through the use of a comparator configured tocompare the pixel signal or the digital value to a sampling threshold.

FIG. 2 illustrates an analog pixel image sensor with multiple pixelsignal thresholds, according to one embodiment. The image sensor of FIG.2 is a CMOS sensor, and includes an IP array 40. The IP array caninclude any number of columns and rows, with any number of IPs percolumn and per row. IP column 50, a column representative of full orpartial IP columns in the IP array, is highlighted in FIG. 2. The IPcolumn 50 includes a plurality of IPs communicatively coupled via thecolumn line 55. IP 60, an IP representative of IPs in the IP array, ishighlighted in FIG. 2.

The IP 60 includes a photo diode 65 together with control elements thatenable the photo diode to be precharged in preparation for exposure andthen sampled after exposure. In operation, a transistor 70 is switchedon to couple the cathode of the photo diode to a voltage source and thus“precharge” the cathode of the photo diode to a precharge voltage. Thetransistor 70 is switched off at or before the start of an exposureinterval. With the transistor 70 off, the cathode voltage incrementallydischarges in response to photon strikes, lowering the photo diodepotential, V_(DET), in proportion to the amount of light detected. Atthe conclusion of the exposure interval, an access transistor 72 isswitched on to enable a signal representative of the photo diodepotential to be amplified/driven onto the column line 55 viafollower-transistor 74 as pixel signal 80.

An ADC 85 is communicatively coupled to the IP column 50 via the columnline 55. In the embodiment of FIG. 2, the ADC is located at the edge ofthe pixel array 40, and may be located within or external to the imagesensor on which the IP array is located. The ADC receives the pixelsignal 80 (the representation of the analog photo diode potential) fromthe IP 60. The ADC digitizes the pixel signal to generate a 3-bitdigital value (“Pix[2:0]”) representative of the pixel signal. The ADCincludes 7 pixel thresholds, Threshold 1 to Threshold 7 (referred toherein as “V_(T1) to V_(T7)”). If the magnitude of the pixel signal isless than V_(pre) but greater than V_(T1), the ADC converts the pixelsignal to the digital value “000”. Pixel signals less than V_(T1) butgreater than V_(T2) are converted to the digital value “001”, pixelsignals between V_(T2) and V_(T3) are converted to “010”, and so forth,up to pixel signals less than V_(T7), which are converted to “111”.

In the embodiment of FIG. 2, the potential difference between successivepixel thresholds is approximately the same (e.g.,V_(T3)−V_(T4)≈V_(T5)−V_(T6)). In other words, the pixel thresholds arelinearly distributed between V_(T1) and V_(T7). In addition, in theembodiment of FIG. 2, the potential difference between V_(pre) andV_(T1) is greater than the potential difference between successive pixelthresholds (e.g., V_(pre)−V_(T1)>V_(T3)−V_(T4)), although in otherembodiments all steps are equal. The selection of V_(T1) such thatV_(pre)−V_(T1)>V_(T3)−V_(T4) reduces the effect of, e.g., dark noisewhen sampling an IP. The potential difference between V_(T7) andV_(floor) in the embodiment of FIG. 2 also can be greater than thepotential difference between successive pixel thresholds (e.g.,V_(T7)−V_(floor)>V_(T3)−V_(T4)). Finally, instead of linear thresholdspacing, a given embodiment can space the thresholds exponentially,e.g., with each threshold spacing doubling from the one below, or inanother pre-determined way that can be converted back to linear. Forsystems that accumulate multiple ADC samples to form an image,non-linear spacing is converted to a linear value prior to accumulation.

V_(floor) represents the pixel saturation threshold at which the cathodevoltage of the photo diode 65 no longer linearly discharges in responseto photon strikes. For pixel signals within the linear sensitivityregion 90, the conversion of pixel signals to digital values is shown ingraph 95. It should be noted that the maximum number of detectablephoton strikes (i.e., the pixel saturation point) is proportional to thecapacitance of the photo diode and thus its physical size. Consequently,in a traditional sensor design the photo diode footprint is dictated bythe dynamic range required in a given application and does not scaleappreciably with shrinking process geometries.

During the capture of an image, in one embodiment the IPs of a given rowor rows in the IP column 50 and each other column in the IP array 40 aresuccessively sampled and the pixel signals associated with each areconverted into digital values using the ADC or ADCs associated with eachcolumn. The digital values output by the ADCs are accumulated(conditionally in some embodiments, as explained below) and storedduring the image capture period. Other types and configurations of IPsthan that illustrated in FIG. 2 can be used in the image sensor system.For instance, a different arrangement of transistors can be used thanthe transistors 70, 72, and 74. In addition, although one ADC 85 isshown in FIG. 2 in conjunction with the IP column 50, in otherembodiments, more than one ADC can be used per IP column, with differentADC groups serving different sections of the array rows of the ADCcolumn. Additional combinations of ADCs (in the form of read circuits)and IPs are described below in greater detail. Finally, the output ofthe ADC (e.g. Pix[2:0] in the embodiment of FIG. 2) can be any multi-bitlength, and can be associated with any number of thresholds distributedin any manner between V_(pre) and V_(floor).

Image Sensor System with Multi-bit Sampling and Conditional Reset

FIG. 3 illustrates an example image sensor read circuit configured toconvert a pixel signal into a multi-bit digital conversion, according toone embodiment. The embodiment of FIG. 3 illustrates an IP 100, an IPmemory 116, and a read circuit 110, the read circuit including anADC/comparator circuit 112 (hereinafter “ADC/comparator”) and an adder114. It should be noted that in other embodiments, the modules of FIG. 3can include additional, fewer, and/or different components. For example,the ADC/comparator can be implemented as separate components, and theadder can be located external to the read circuit.

The IP 100 represents an IP in an image sensor, and can be, forinstance, the IP 60 of FIG. 2. The IP 100 receives one or more controlsignals, for instance from external control logic. A control signal canenable the IP to begin an image capture, for instance by resetting theIP to Vpre and enabling the exposure of the IP's photosensitive elementto light to result in the storing of charge relative to Vpre. Similarly,a control signal can enable the IP to end an image capture, for instanceby disabling the exposure of the IP' s photosensitive element to lightafter the passing of an image capture period. A control signal can alsoenable the outputting of a pixel signal by an IP and the subsequentconversion of the pixel signal to a digital value representative of thepixel signal by a read circuit (referred to herein as “sampling the IP”or “sampling the pixel signals”). As described above, a pixel signal canbe a representation of the integrated charge (e.g., a source followervoltage, an amplified voltage, or a current having a componentproportional to the integrated charge).

The IP 100 receives a reset signal, for instance from external controllogic. The reset signal resets the charge stored by the IP to Vpre, forinstance at the beginning of an image capture period. The IP alsoreceives a conditional reset signal from the ADC/comparator 112 (in somecircuits, the conditional reset and initial reset are supplied usingcommon circuitry). The conditional reset signal resets the charge storedby the IP, for instance during an image capture period in response to apixel signal exceeding a sampling threshold when the IP is sampled. Itshould be noted that in other embodiments, the conditional reset signalis received from a different entity. In one implementation, theADC/comparator may determine that the pixel signal exceeds a samplingthreshold, and may enable external control logic to output a conditionalreset signal to the IP; in such an embodiment, the reset signal (arow-wise signal) and the conditional reset signal (a column-wise signal)may be ANDed by the IP to initiate all resets. For simplicity, theremainder of the description will be limited to embodiments in which theADC/comparator provides conditional reset signals to the IP.

The read circuit 110 receives a threshold signal, a sample signal (or“sample enable signal”), a compare signal (or “compare enable signal”),a residue signal (or “residue enable signal”), and a reset signal, forinstance from external control logic, and receives pixel signals fromthe IP 100. The IP memory element 116 corresponding to IP 100 receives areadout signal that selects it for readout/write by adder 114 and forexternal readout. The ADC/comparator 112 samples the IP 100 in responseto receiving one or more sample signals. During an image capture, theADC/comparator receives a sample signal at various sampling intervals,for instance periodically or according to a pre-defined samplinginterval pattern (referred to herein as a “sampling policy”).Alternatively, the sample signal received by the ADC/comparator caninclude a sampling policy, and the ADC/comparator can be configured tosample the IP based on the sampling policy. In other embodiments, the IPreceives one or more sample signals and outputs pixel signals based onthe received sample signals. In yet other embodiments, the IP outputspixel signals periodically or according to a sampling policy, or theADC/comparator samples pixel signals periodically or according to asampling policy, independent of received sample signals. TheADC/comparator can request a pixel signal from the IP prior to samplingthe pixel signal from the IP.

During a sampling of the IP, the ADC/comparator 112 receives a pixelsignal from the IP and converts (optionally in some embodiments based onthe pixel signal exceeding the sampling threshold) the pixel signal to amultiple-bit digital value representative of the pixel signal. If thepixel signal exceeds a sampling threshold, the ADC/comparator outputs aconditional reset signal to reset the charge stored at the IP. If thepixel signal does not exceed a sampling threshold, the ADC/comparatordoes not output a conditional reset signal to reset the charge stored atthe IP. The sampling threshold can be varied during the image captureand received via the threshold signal, or can be pre-determined orpreset for a given image capture. One sampling threshold can be usedduring multiple image captures, different sampling thresholds can beused for different image captures, and multiple sampling thresholds canbe used during a single image capture. In one embodiment, the samplingthreshold varies in response to detected changing light conditions (forinstance, the sampling threshold can decrease in response to low lightconditions, and can increase in response to high light conditions).

In one embodiment, the sampling threshold is an analog signal threshold.In this embodiment, the ADC/comparator 112 includes an analog comparatorand compares the pixel signal to the sampling threshold to determine ifthe pixel signal exceeds the sampling threshold. If the pixel signalincludes a voltage representative of the charge stored by the IP 100,the sampling threshold is exceeded if the pixel signal is lower than thesampling threshold. Using the embodiment of FIG. 2 as an example, if thesampling threshold of the ADC/comparator is Threshold 4, then the pixelsignal will exceed the sampling threshold only if the pixel signalincludes a voltage lower than the voltage associated with Threshold 4.

In one embodiment, the sampling threshold is a digital signal threshold.In this embodiment, the ADC/comparator 112 includes a digitalcomparator, and first converts the pixel signal to a digital valuerepresentative of the pixel signal. The ADC/comparator then compares thedigital value to the sampling threshold to determine if the pixel signalexceeds the sampling threshold. Using the embodiment of FIG. 2 as anexample, for a sampling threshold of “101”, if the ADC/comparatorconverts a pixel signal to a digital value of “001” (indicating that thepixel signal is between Threshold 1 and Threshold 2), then the pixelsignal does not exceed the sampling threshold and a conditional resetsignal is not outputted. However, if the ADC/comparator converts a pixelsignal to a digital value of “110” (indicating that the pixel signal isbetween Threshold 6 and Threshold 7), then the pixel signal does exceedthe sampling threshold and a conditional reset signal is outputted.

In another embodiment, the sampling threshold is a digital signalthreshold that can be evaluated prior to the complete digital conversionof the pixel signal. This can be advantageous in some embodiments or usecases to allow faster conditional reset of a pixel, and/or power savingsby avoiding unneeded ADC operations. For instance, with a successiveapproximation register ADC, multiple clock cycles are used to resolvethe digital representation of the pixel signal. The first clock cycleresolves the most significant bit, the second clock cycle the next mostsignificant bit, etc., until all bit positions have been resolved. Usingthe embodiment of FIG. 2 as an example, for a sampling threshold of“100,” a determination of whether the threshold is met or not can beresolved after the first SAR ADC clock cycle. For a sampling thresholdof “110,” a determination of whether the threshold is met or not can beresolved after the second SAR ADC clock cycle. For embodiments with abit depth of, e.g., 6 or 8 bits, making a reset determination after oneor two conversion cycles can result in significant time/power savings,which can be realized by selecting a sampling threshold with one or moreLSBs that are 0.

In one embodiment, a row-wise compare signal is supplied to eachADC/comparator “compare” signal input, and signals the ADC/comparator asto the appropriate clock cycle to perform the comparison. When thecompare signal is asserted, the comparison is performed based on thecurrent state of the analog-to-digital conversion. If the threshold ismet by the compare for ADC/comparator 112, the conditional reset signalis asserted to IP 100 and to adder 114, and the SAR ADC continuesconverting the pixel signal. If the threshold is not met, theconditional reset signal is not asserted, and can be used in conjunctionwith the compare signal to gate the clock signal of SAR ADC to terminatethe conversion.

The ADC/comparator 112 outputs a digital value representative of a pixelsignal received by the ADC/comparator (referred to herein as a “digitalconversion”) to the adder 114. The ADC/comparator 112 can output adigital conversion in response to the pixel signal associated with thedigital conversion exceeding a sampling threshold. The conditional resetsignal can be used as an enable to signal to the adder 114 to load thedigital conversion and add it to the IP memory 116 locationcorresponding to IP 100 (which in this embodiment is selected from aplurality of such locations by address selection of the readout line).In other embodiments, the ADC/comparator outputs a digital conversionduring each sampling of the IP 100, regardless of whether the pixelsignal associated with the digital conversion exceeds a samplingthreshold. In these embodiments, the adder can be configured toaccumulate digital conversions associated with pixel signals that exceeda sampling threshold and to disregard digital conversions associatedwith pixel signals that do not exceed a sampling threshold. Alternately,if the threshold is set to “001” in FIG. 2, for example, the adder canunconditionally add the digital conversion to IP memory 116 each time IP100 is read, while still producing correct results. In some embodiments,adder 114 may be configured to execute a weighted sum in which the valueto be accumulated is multiplied with a weighting factor prior to addingto the IMP memory 116. The weight factor can depend on the samplingpolicy, the subframe being added, etc.

In one embodiment, the ADC/comparator 112 also outputs a digitalconversion in response to receiving a residue signal assertion (withoutthe compare signal being asserted). The residue signal assertion isassociated with the end of an image capture, and enables theADC/comparator to output a full digital conversion to the adder 114regardless of whether the pixel signal associated with the digitalconversion exceeds a sampling threshold, and asserts the conditionalreset. The residue signal can prevent the loss of image informationassociated with light received by the IP 100 but not surpassing thethreshold at the end of a capture period. If the pixel signalrepresentative of such received light does not exceed the samplingthreshold, the ADC/comparator otherwise may not output the digitalconversion associated with the pixel signal, and the charge stored bythe IP would not be reset by the conditional reset signal (which is alsotriggered by assertion of the residue signal). In embodiments where theADC/comparator outputs digital conversions to the adder regardless ofwhether the pixel signals associated with the digital conversions exceeda sampling threshold, the adder can receive the residue signal, and canbe configured to accumulate a digital conversion associated with a pixelsignal received at the end of a capture period in response to receivingthe signal.

The adder 114 is configured to accumulate digital conversions receivedduring a capture period. As discussed above, in embodiments in which theADC/comparator 112 outputs digital conversions only if the pixel signalsassociated with the digital conversions exceed a sampling threshold, theadder accumulates all received digital conversions (including theadditional digital conversion output by the ADC/comparator in responseto receiving a residue signal) into IP memory 116. In embodiments inwhich the ADC/comparator outputs digital conversions associated witheach received pixel signal, the adder accumulates only the digitalconversions associated with pixel signals that exceed the samplingthreshold, plus the digital conversion output by the ADC/comparator inresponse to receive a residue signal, into IP memory 116; suchembodiments require the adder to be aware of when pixel signals exceed asampling threshold and when a residue signal is received, and are notdiscussed further herein for the purpose of simplicity.

The adder 114 receives reset/add control signaling, for instance fromexternal control logic. In response to receiving a reset signal (forinstance at the beginning of an image capture period), the accumulatorstores all zeros to the selected IP memory location 116 the accumulationof received digital conversions as image data. The adder also receives areset signal and resets the accumulation of received digitalconversions.

In alternative embodiments, the adder is located external to the readcircuit 110. For instance, the ADC/comparator can output a stream ofconversions to a digital channel (e.g., multiplexed with otherconversions from other ADCs) to a separate circuit that supplies theaccumulation function. In such a case, the ADC/comparator must alsooutput a symbol for “no conversion,” which can be 0. One possibility isfor a circuit in the digital channel interface (e.g., PHY 134 in FIG. 4)to code digital conversions to reduce bandwidth. A “no conversion” inone embodiment is output as a “00,” a upper threshold exceeded ADCconversion is output as a “01,” and all other ADC conversions are outputas “1xxxxxx,” where an x represents one of the resolved bits of the ADCconversion and the number of x positions is equal to the bit depth ofthe ADC.

In one embodiment, the IP is configured to output a pixel signal andreceive a conditional reset on the same line. In this embodiment, the IPand the ADC/comparator 112 alternately drive the pixel signal and theconditional reset on the shared line. For example, the IP can output apixel signal on the shared line during a first portion of a sampleperiod, and can receive conditional resets on the shared line during asecond portion of a sample period. Finally, the ADC/comparator canreceive a threshold signal, a sample signal, and a residue signal on ashared line. For example, the ADC/comparator can receive a thresholdsignal at the beginning of an image capture, can receive sample signalsthroughout the image capture period, and can receive a residue signal atthe end of the image capture period. It should also be noted that thereset signal received by the IP can be the same reset signal received bythe accumulator 114, and can be received on a shared line.

FIG. 4 illustrates an example embodiment of an image sensor system witha multi-bit architecture, according to one embodiment. The image sensorsystem 120 of FIG. 4 includes an image sensor region 125, a read circuitarray 130, control logic 132, and a physical signaling interface 134. Inother embodiments, the image sensor system may include fewer,additional, or different components than illustrated in the embodimentof FIG. 4 (for instance, the circuit may have memory 116 integratedtherewith). The image sensor system shown in FIG. 4 can be implementedas a single IC, or can be implemented as multiple ICs (for instance, theimage sensor region and the read circuit array can be located onseparate ICs). Further, various components (such as the read circuitarray, the control logic, and the physical signaling interface) can beintegrated within the image sensor region 125.

For purposes of example, the image sensor system 120 and a host IC (notshown in FIG. 4) communicatively coupled to the image sensor system areassumed to form the primary image acquisition components within a camera(e.g., a still-image or video camera within a mobile device, compactcamera, digital SLR camera, stand-alone or platform-integrated webcam,high-definition video camera, security camera, automotive camera, etc.).The image sensor IC and host IC can be more generally deployed alone ortogether with like or different imaging components within virtually anyimaging system or device including without limitation metrologyinstruments, medical instruments, gaming systems or other consumerelectronics devices, military and industrial imaging systems,transportation-related systems, space-based imaging systems and soforth. Operation of the image sensor system generally involves thecapture of an image or frame through the exposure of IPs to light, theconversion of stored charge as a result of the exposure into image data,and the outputting of the image data to a storage medium.

The image sensor region 125 includes an IP array 127 including N-rows(indexed from 0 to N−1) and M-columns (indexed from 0 to M−1). Thephysical signaling interface 134 is configured to receive commands andconfiguration information from a host IC (e.g., a general-purpose orspecial-purpose processor, application-specific integrated circuit(ASIC) or any other control component configured to control the imagesensor IC), and is configured to provide the received commands andconfiguration information to the control logic 132. The physicalsignaling interface is also configured to receive image data from theread circuit array 130 and to output received image data to the host IC.

The control logic 132 is configured to receive commands andconfiguration information from the physical signaling interface 134, andis configured to transmit signals configured to manipulate theoperations and functionality of the image sensor system 120. Forexample, in response to receiving a command to capture an image orframe, the control logic may output a series of exposure signals(configured to cause IPs to reset) and sample signals (configured tocause the read circuits in the read circuit array 130 to sample thepixel signals from the IPs in the IP array 127), enabling the capture ofthe image or frame by the image sensor system. Similarly, in response toreceiving a command to initialize or reset the image sensor system, thecontrol logic may output reset signals configured to reset each IP inthe IP array, causing each IP to disregard any accumulated charge. Thecontrol signals produced by the control logic identify particular IPswithin the IP array for sampling, may control the functionality of readcircuits associated with IPs, or may control any other functionalityassociated with the image sensor system. The control logic is shown inFIG. 4 as external to the image sensor region 125, but as noted above,all or portions of the control logic may be implemented locally withinthe image sensor region.

The control logic 132 outputs control and reset signals for each IP inthe image sensor region 125. As illustrated in the embodiment of FIG. 4,each IP in an image pixel IP[X][Y] receives a row-parallel Cntrl[X]signal (corresponding to a “row” select control signal for each IP) anda row-parallel Reset[X] signal from the control logic to reset the IPs,wherein “X” and “Y” refer to the coordinates of the IP within the imagesensor region. Although the control signal and reset signals received atany given IP are each only 1 bit as indexed in the embodiment of FIG. 4,it is to be appreciated that such an indexing is done for the purposesof simplicity only, and that these signals may in practice be any widthor dimension.

The read circuit array 130 includes M read circuits, each configured toreceive pixel signals from a column of IPs in the IP array 127. Itshould be noted that in other embodiments, the read circuit array caninclude multiple read circuits configured to receive pixel signals fromeach IP column, as is discussed in FIGS. 5a, 5b, and 5c . A pixel signalbus couples the IPs in each IP column in the IP array to the readcircuit associated with the IP column within the read circuit array.Each IP is configured to output a pixel signal produced by the IP to thepixel signal bus, and each read circuit is configured to sample thepixel signals from the IPs in the IP column associated with the readcircuit. For example, read circuit 0 is configured to sample pixelsignals from pixel signal bus 0, and so forth. Each read circuit in theread circuit array can sample pixel signals iteratively from IPs in theIP column associated with the read circuit (for instance, by samplingpixel signals from successive IPs in order over multiple passes), or cansample pixel signals according to a pre-determined non-sequential order.In one embodiment, read circuits can sample multiple pixel signalssimultaneously. Although not illustrated in the embodiments of FIG. 3and FIG. 4, the read circuits can additionally include memoriesconfigured to store accumulated digital values prior to outputting theaccumulated values as image data.

A conditional reset bus couples the IPs in each IP column in the IParray 127 to the read circuit associated with each IP column. Aftersampling a pixel signal from an IP in an IP column, the read circuitassociated with the IP column produces a conditional reset signal if thesampled pixel signal exceeds a sampling threshold. For example, if an IPin an IP column outputs a pixel signal to a read circuit associated withthe IP column via the pixel signal bus coupling the IP to the readcircuit, and if the read circuit determines that the pixel signalexceeds a sampling threshold, the read circuit outputs a conditionalreset signal to the IP via the conditional reset bus coupling the readcircuit to the IP and the IP resets the charge stored at the IP. Asdescribed above, the pixel signal bus and the conditional reset bus canbe implemented in a shared bus with Cntrl[X] enabling pixel signals tobe output from row X to the shared bus and Reset[X] enabling conditionalreset for pixels in row X from the shared bus, though such embodimentsare not described further herein for the purposes of simplicity.

The control logic 132 produces read control signals for the readcircuits in the read circuit array 130. The read control signals cancontrol the sampling of pixel signals from the IPs in the IP array 127by the read circuits, the conversion of sampled pixel signals intodigital values, the accumulation of the digital values, the outputtingof the accumulated digital values, and the resetting of the adders. Theread control signals can include a threshold signal, a sample signal, acompare signal, a residue signal, a readout signal, and a reset/addsignal for each read circuit in the read circuit array as described inFIG. 3.

The control logic 132 is configured to produce read control signals forthe read circuit array 130 to enable the capture of an image over animage capture period. Prior to the image capture period or at the firstuse of a particular IP memory location for an image capture period, thecontrol logic can produce a reset to cause the accumulator of each readcircuit 110 to reset the IP memory location. At the beginning of theimage capture period, the control logic can produce a threshold signalfor each of the read circuits; as discussed above, the threshold signalis used by each read circuit to determine a threshold to which pixelsignals are compared for the purposes of conditionally resetting IPsassociated with the pixel signals and accumulating digital valuesassociated with the pixel signals. During the image capture period, thecontrol logic can produce a series of sample signals configured toenable the read circuits to sample pixel signals from IPs associatedwith the read circuits. In one embodiment, the control logic producessample signals according to one or more sampling policies. Samplingpolicies are described in greater detail below. At the end of the imagecapture period, the controlled logic produces a residue signalconfigured to enable each read circuit to accumulate a digital valuerepresentative of a pixel signal regardless of whether the pixel signalexceeds a sampling threshold. After the image capture period, thecontrol logic produces a readout signal configured to enable each readcircuit to output the accumulated digital values representative ofsampled pixel signals that exceed an associated sampling threshold asimage data. The control logic may also produce a reset signal after eachimage capture period to reset the accumulated digital values within eachread circuit.

The control logic may also be configured to produce pause and resumesignals configured to cause the IPs and the read circuits to pause andresume an image capture, and to produce any other signal necessary tocontrol the functionality of the IPs and read circuits in the readcircuit array. For each read circuit, the image data output by the readcircuit is a digital representation of the light captured by each IP inan IP column associated with the read circuit. The image data isreceived by the physical signaling interface for subsequent output to ahost IC.

FIG. 5 illustrates an example image sensor system architecture with readcircuit arrays located peripherally to an IP array, according to oneembodiment. In the architecture of FIG. 5, six read circuit arrays (140a, 140 b, 140 c, 140 d, 140 e, and 140 f) are located around an imagesensor region 145 including an IP array. Unlike the embodiment of FIG.4, in which one read circuit array 130 is located to one side of theimage sensor region 125, the read circuit arrays 140 of FIG. 5 arelocated on all sides of the image sensor region 145. The read circuitarrays can be located within an IC also containing the image sensorregion, or can be located on one or more separate ICs. For example, eachread circuit array could be located on the periphery of an image sensorIC, or could be located in dedicated read circuit array ICs locatedadjacent to the image sensor IC.

In the previous embodiment of FIG. 4, each read circuit in the readcircuit array 130 is coupled to an IP column in the IP array 127. In theembodiment of FIG. 5, each read circuit array 140 x is coupled to a setof six IPs from partial rows and partial columns of the image sensorregion 145. For example, read circuit array 140 a is coupled to IP1,IP2, IP3, IP7, IP8, and IP9. Each read circuit array 140 x includes oneor more read circuits. In one embodiment, each read circuit arrayincludes 6 read circuits, with each read circuit in a read circuit arraycoupled to one IP. In such an embodiment, each read circuit samples onlythe IP to which it is coupled. More typically, each read circuit will beshared by a block of IPs comprising a large number of rows and one ormore columns. Although control logic is not illustrated in theembodiment of FIG. 5, each read circuit array can be coupled touniversal control logic, or each may be coupled to dedicated controllogic. Further, although a physical signaling interface is notillustrated in the embodiment of FIG. 5, each read circuit array mayoutput image data via a common bus to a common physical signalinginterface, or may output image data via a dedicated bus to a dedicatedphysical signaling interface coupled to each read circuit array.

FIG. 6a illustrates a top view of a pixel array IC in an exampletwo-layer image sensor system architecture, according to one embodiment.The pixel array IC of FIG. 6a includes peripheral circuitry 162surrounding an IP array. The IP array includes row control circuitry 164and four row groups of IPs (IP Row Groups 0 through 3). Each IP rowgroup is the width of the array and includes one-fourth of the rows inthe array, and the row control circuitry provides control and resetsignals needed for operation of the IPs (for instance, signalsconfigured to cause the IPs to be enabled for reset and selected forreadout, and any other signals discussed herein).

FIG. 6b illustrates a top view of a preprocessor IC in an exampletwo-layer image sensor system architecture, according to one embodiment.The preprocessor IC of FIG. 6b includes peripheral circuitry 172surrounding a read circuit array. The read circuit array includes aphysical signaling interface 175 (which may alternately be on pixelarray IC 160), read control circuitry 176, four read circuit arrays(read circuit array 0 through 3), and accompanying memory groups 0A/B,1A/B, 2A/B, and 3A/B. Each read circuit array includes one or more readcircuits (including an ADC, adder, and reset logic for each IP column)connected to corresponding rows in an associated memory group. When aparticular IP row is selected in an IP row group of the pixel array IC,a corresponding row in the corresponding memory group is selected on thepreprocessor IC.

FIG. 6c illustrates a cross section of the pixel array IC of FIG. 6a andthe preprocessor IC of FIG. 6b in an example two-layer image sensorsystem architecture, according to one embodiment. In the embodiment ofFIG. 6c , the pixel array IC 160 is located above the preprocessor IC170 such that the bottom surface of the pixel array IC is coupled to thetop surface of the preprocessor IC. A microlens array 180 and a colorfilter array 182 are located above the pixel array IC. The pixel arrayIC and the processor IC are coupled via pixel array IC wiring 184 andpreprocessor IC wiring 186. By locating the pixel array IC above thepreprocessor IC, the die size and percentage of surface area in theimage sensor system capable of capturing light is increased. Forinstance, in a single-layer IC architecture including an IP array andone or more read circuit arrays, the portion of the single-layer ICincluding the one or more read circuit arrays are incapable of capturinglight; such an embodiment reduces the percentage of silicon die used tocapture light incident upon the single-layer IC. This requires thecamera module footprint to be larger than the lens and the imagingarray, and increases the cost and size of the camera module. Thetop-layer of the embodiment of FIG. 6c , in contrast, does not includeread circuit arrays, so the die size of the top single layer IC isreduced to approximately the size of the IP array. Light incident uponthe top-layer passes through the microlens array and the color filterarray, is captured by the IPs in the IP array, and signalsrepresentative of the captured light are sampled by the read circuitarrays via the pixel array IC wiring and the preprocessor IC wiring.

FIG. 7 illustrates the operation of an image sensor read circuit, suchas the read circuit of FIG. 3, according to one embodiment. In theexample embodiment of FIG. 7, an image is captured over the course of 16sampling intervals. The ADC of the example embodiment of FIG. 7 convertspixel signals to 5-bit digital values, and the accumulator accumulates5-bit digital values into a 9-bit digital value during the image captureperiod. Further, in the embodiment of FIG. 7, the ADC converts receivedpixel signals into digital values representing the pixel signals suchthat each additional photon detected by an IP results in an increase inthe digital value by one. For example, if an IP detects 5 photons afterbeing reset, the pixel signal produced by the IP will be converted bythe ADC into the value “00101”. It should be emphasized that in otherembodiments, the ADC converts received pixel signals into digital valuesrepresenting the pixel signals such that multiple additional photonsdetected by an IP results in an increase in the digital value by one. Inthe embodiment of FIG. 7, pixel signals are analog voltages, and thusaren't shown in FIG. 7 for the purposes of simplicity.

At the beginning of the image capture period (sampling interval 0), acontrol signal is received configured to configure an IP of the readcircuit to be reset and begin exposure. In the embodiment of FIG. 7, the“begin exposure” control signal also resets the value stored at thememory element corresponding to the IP to zero. In addition, a thresholdsignal is received to set the sampling threshold for the read circuit ata pixel signal equivalent to 20 photons.

During the first sampling interval, 4 photons are detected by the IP.The IP then produces a pixel signal representing the charge collected bya photosensitive element within the IP equivalent in response todetecting the 4 photons, and the ADC converts this pixel signal to thedigital value “00100”. Since the 4 detected photons do not trigger thesampling interval of 20 photons (“10100”), the accumulator does notaccumulate the digital value “00100”, and the charge stored by the IP isnot dissipated (the IP is not reset). Note that the column “Photons(det.-accum.)” indicates first the number of photons detected by the IPduring a particular sampling interval and second the number ofaccumulated photons since the last conditional reset of the IP.

During sampling interval 2, 7 additional photons are detected by the IP.The charge stored by the IP increases from the charge produced inresponse to detecting 4 photons during sampling interval 1 to a chargeproduced in response to detecting 11 accumulated photons (4 photonsduring sampling interval 1 and 7 photons during sampling interval 2).The pixel signal produced by the IP in response to the stored charge isconverted to the digital value “01011”. Since the total 11 photons donot trigger the sampling threshold of 20 photons, the accumulator doesnot accumulate the digital value “01011”, and the IP is not reset.Similarly, during sampling interval 3, 2 additional photons are detectedby the IP, and the charge stored by the IP increases to a chargeproduced in response to detecting 13 accumulated photons (4 photonsduring sampling interval 1, 7 during sampling interval 2, and 2 duringsampling interval 3). The pixel signal produced by the IP in response tothis increased stored charge is converted to the digital value “01101”.Since the accumulated 13 photons do not trigger the sampling thresholdof 20 photons, the accumulator does not accumulate the digital value“01101”, and the IP is not reset.

During sampling interval 4, 11 additional photons are detected by theIP. The charge stored by the IP increases to a charge equivalent todetecting 24 accumulated photons (4 during sampling interval 1, 7 duringsampling interval 2, 2 during sampling interval 3, and 11 duringsampling interval 4). The pixel signal produced by the IP in response tothe stored charge is converted to the digital value “11000”. Since theaccumulated 24 photons exceeds the sampling threshold of 20 photons, theadder accumulates the digital value “11000” into the memory element forthe IP, and the IP is reset.

The 14 photons detected during sampling interval 5 do not exceed thesampling interval of 20, the digital value produced by the ADC, “01110”is not accumulated and the IP is not reset. The 8 photons detectedduring sampling interval 6 results in an accumulated detection of 22photons by the IP (14 photons during sampling interval 5, and 8 duringsampling interval 6), and the adder accumulates the digital value“10110” (resulting in a total accumulated value of “000101110” into thememory element), and the IP is reset.

This process is repeated for each of the 16 sampling intervals. Thedigital values produced by the ADC during sampling intervals 10, 14, and15 are all accumulated in response to the sampling threshold of 20photons being exceeded by the number of accumulated photons detected bythe IP. Accordingly, the IPs are reset for the sampling intervalsfollowing these intervals (sampling interval 11, 15, and 16). Duringsampling interval 16, 19 photons are detected by the IP, which does notexceed the sampling threshold of 20 photons. In addition, duringsampling interval 16, a residue signal is received configured toinstruct the accumulator to accumulate the digital value produced by theADC (the residue value 190, “10011”). Accordingly, the adder accumulatesthe value “10011” to the maintained accumulation value “001111011” inthe memory element to produce the image data 195, “010001110”. Finally,a reset signal is received during sampling interval 16, which enablesthe read circuit to output the image data and which resets the valuesoutput by the ADC and stored at the accumulator to zero subsequent tooutputting the image data.

FIG. 8 illustrates pixel information flow in an image capture system,according to one embodiment. During the course of an image captureperiod, an IP 200 detects photons and outputs pixel signals 202 to theread circuit. In response, the read circuit 204 converts the receivedpixel signals to digital values representative of the receive pixelsignals, and for each digital value associated with a pixel signal thatexceeds a sampling threshold, accumulates the digital value and resetsthe IP. After the image capture period, the accumulated digital valuesare output as image data 206.

A post processing module 208 receives the image data 206 and performsone or more processing operations on the image data to produce theprocessed data 210. In one embodiment, a response function can be usedto transform the image data 206 according to a desired response. Forexample, the image data can be transformed with a linear function or alogarithmic function based on the intensity of the light detected by theIP. The processed data is then stored in memory 212 for subsequentretrieval and processing. The IP 200, the read circuit 204, the postprocessing module, and the memory can be located within an IC, or can belocated within separate coupled ICs.

FIG. 9 illustrates various temporal sampling policies for use by animage sensor read circuit, such as the read circuit of FIG. 3, accordingto one embodiment. In the embodiment of FIG. 9, an image is capturedover an image capture period 220 equivalent to 16 time units. For eachof the three illustrated sampling policies, an “x” indicates thesampling of a given IP by a read circuit.

In sampling policy 1, the read circuit samples the IP after each of the16 time units. In sampling policy 2, the read circuit samples the IPafter every 4 time units. As the read circuit in sampling policy 2samples the IP less frequently than the read circuit in sampling policy1, the IP in sampling policy 2 is more likely to saturate than the IP insampling policy 1. However, the resources (processing, bandwidth, andpower) required to implement sampling policy 2 (4 total samples) may belower than the resources required to implement sampling policy 1 (16total samples), since the read circuit in sampling policy 2 samples theIP only 25% as often as the read circuit in sampling policy 1.

In sampling policy 3, the read circuit samples the IP after time units1, 2, 4, 8, and 16. The exponential spacing of the samplings of samplingpolicy 3 provide short sample intervals (for instance, the sampleinterval between time unit 0 and time unit 1) and long sample intervals(for instance, the sample interval between time unit 8 and time unit16). Allowing for both short and long sampling intervals preserves thedynamic range of sampling policy 1 with nearly as few samplings assampling policy 2 (5 samplings for sampling policy 3 vs. 4 samplings forsampling policy 2). Other sampling policies not illustrated in FIG. 9may also be implemented by read circuits in the image sensor systemsdescribed herein. Depending on the overall length of an exposureinterval or other scene- or user-dependent factors, different samplingpolicies can be selected to meet desired power, SNR, dynamic range, orother performance parameters.

High-SNR Image Sensor with Non-Destructive Threshold Monitoring

While the three-transistor (3 T) pixel architecture shown in FIG. 2 issuitable for many applications, four-transistor (4 T) designs having a“transfer gate” disposed between the photodiode and source follower(i.e., between node “V_(DET)” of photosensitive element 65 and element74 in FIG. 2) provide a number of advantages. First, the now-isolatedfloating diffusion at the gate of the source follower may be reset(e.g., coupled to V_(DD)) without disturbing the charge state of thephotodiode, thereby enabling a correlated double-sampling (CDS)operation in which the noise floor of the floating diffusion is sampledprior to charge integration and then subtracted from the subsequentsampling of the photodiode potential, canceling the noise andsignificantly improving the SNR. Another advantage is,counterintuitively, a more compact pixel design as the switchedconnection between the photodiode and source follower (i.e., via thetransfer gate) enables the source follower, reset and access transistorsto be shared among multiple photodiodes. For example, only seventransistors are required to implement a set of four “4 T” pixels havinga shared source follower, reset transistor and access transistor (i.e.,four transfer-gates plus the three shared transistors), thus effectingan average of 1.75 transistors per pixel (1.75 T).

In terms of pixel read-out, the direct connection between photodiode andsource follower in a 3 T pixel permits the charge state of thephotodiode to be read-out without disturbing ongoing photochargeintegration. This “non-destructive read” capability is particularlyadvantageous in the context of the conditional reset operation describedabove as the 3 T pixel may be sampled following an integration intervaland then conditionally permitted to continue integrating charge (i.e.,not be reset) if the sampling operation indicates that the charge levelremains below a predetermined threshold. By contrast, the chargetransfer between photodiode and floating diffusion as part of a 4 Tpixel readout disrupts the state of the photodiode, presenting achallenge for conditional-reset operation.

In a number of embodiments described below in connection with FIGS.10-14, a modified 4 T pixel architecture is operated in a manner thatdissociates the reset threshold from pixel sample generation to enable anon-destructive (and yet CDS) overthreshold determination. That is,instead of reading out the net level of charge accumulated within thephotodiode (i.e., a pixel sampling operation) and conditionallyresetting the photodiode based on that read-out (i.e., as in a 3 T pixelsampling operation), a preliminary overthreshold sampling operation isexecuted to enable detection of an overthreshold state within thephotodiode, with the full photodiode read-out (i.e., pixel samplegeneration) being conditionally executed according to the preliminaryoverthreshold detection result. In effect, instead of conditionallyresetting the photodiode according to the pixel value obtained from fullphotodiode readout, full photodiode readout is conditioned on the resultof a preliminary, non-destructive determination of whether the thresholdhas been exceeded; an approach enabled, in at least one embodiment, bydissociating the conditional-reset threshold from the pixel valuegeneration.

FIG. 10 illustrates an embodiment of a modified 4 T pixel 250, referredto herein as a “progressive read-out pixel,” in which a non-destructiveoverthreshold detection operation is executed to enableconditional-reset operation in conjunction with correlated doublesampling. As explained more fully below, the overthreshold detectioninvolves a limited read-out of the photodiode state which, whendetermined to indicate an overthreshold condition, will trigger a morecomplete read-out of the photodiode state. That is, pixel 250 isread-out in a progression from a limited overthreshold detectionread-out to a complete read-out (the latter being conditional accordingto the overthreshold detection result).

Still referring to FIG. 10, progressive read-out pixel 250 includes atransfer gate 251 disposed between a photodiode 260 (or any otherpracticable photosensitive element) and floating diffusion node 262, anda transfer-enable transistor 253 coupled between a transfer-gate rowline (TGr) and transfer gate 251. The gate of transfer-enable transistor253 is coupled to a transfer-gate column line (TGc) so that, when TGc isactivated, the potential on TGr is applied (minus any transistorthreshold) via transfer-enable transistor 253 to the gate oftransfer-gate 251, thus enabling charge accumulated within photodiode260 to be transferred to floating diffusion 262 and sensed by the pixelreadout circuitry. More specifically, floating diffusion 262 is coupledto the gate of source follower 255 (an amplification and/orcharge-to-voltage conversion element), which is itself coupled between asupply rail (V_(DD) in this example) and a read-out line, Vout, toenable a signal representative of the floating diffusion potential to beoutput to read-out logic outside the pixel.

As shown, a row-select transistor 257 is coupled between the sourcefollower and the read-out line to enable multiplexed access to theread-out line by respective rows of pixels. That is, row-select lines(“RS”) are coupled to the control inputs of row-select transistors 257within respective rows of pixels and operated on a one-hot basis toselect one row of pixels for sense/read-out operations at a time. Areset transistor 259 is also provided within the progressive read-outpixel to enable the floating diffusion to be switchably coupled to thesupply rail (i.e., when a reset-gate line (RG) is activated) and thusreset. The photodiode itself may be reset along with the floatingdiffusion by fully switching on transfer gate 251 (e.g., by assertingTGc while TGr is high) and reset transistor 259 concurrently, or bymerely connecting the photodiode to a reset-state floating diffusion.

FIG. 11 is a timing diagram illustrating an exemplary pixel cycle withinthe progressive read-out pixel of FIG. 10. As shown, the pixel cycle issplit into five intervals or phases corresponding to distinct operationscarried out to yield an eventual progressive read-out in the final twophases. In the first phase (phase 1), a reset operation is executedwithin the photodiode and floating diffusion by concurrently assertinglogic high signals on the TGr, TGc and RG lines to switch ontransfer-enable transistor 253, transfer gate 251 and reset transistor259, thereby switchably coupling photodiode 260 to the supply rail viatransfer gate 251, floating diffusion 262 and reset transistor 259 (theillustrated sequence can begin with an unconditional reset (e.g., at thestart of a frame), and can also begin from a preceding conditionalread-out/reset operation). To conclude the reset operation, the TGr andRG signals (i.e., signals applied on like-named signal lines) arelowered, thereby switching off transfer gate 251 (and reset transistor259) so that the photodiode is enabled to accumulate (or integrate)charge in response to incident light in the ensuing integration phase(phase 2). Lastly, although the row-select signal goes high during thereset operation shown in FIG. 11, this is merely a consequence of animplementation-specific row decoder that raises the row-select signalwhenever a given row address is decoded in connection with arow-specific operation (e.g., raising the TGr and RG signals duringreset directed to a given row). In an alternative embodiment, the rowdecoder may include logic to suppress assertion of the row-select signalduring reset as indicated by the dashed RS pulse in FIG. 11.

At the conclusion of the integration phase, the floating diffusion isreset (i.e., by pulsing the RG signal to couple the floating diffusionto the supply rail) and then sampled by a sample-and-hold element withinthe column read-out circuit. The reset and sample operation (shown asphase 3 in FIG. 11), in effect, samples the noise level of the floatingdiffusion and is executed in the embodiment shown by asserting therow-select signal for the pixel row of interest (i.e., the “i^(th)”pixel row, selected by RSi) while pulsing a reset-state sample-and-holdsignal (SHR) to convey the state of the floating diffusion to thesample-and-hold element (e.g., a switch-accessed capacitive element)within the column read-out circuit via read-out line, Vout.

After acquiring the noise sample in phase 3, an overthreshold detectionoperation is executed in phase 4 by raising the TGr line to apartially-on, “overthreshold-detection” potential, VTG_(partial),concurrently with switching on transfer-enable transistor 253 (i.e., byasserting a logic high TGc signal, although in this embodiment TGc isalready on). By this operation, illustrated graphically in FIGS. 12 and13, VTG_(partial) is applied to transfer gate 251 to switch the transfergate to a “partial on” state (“TG partial on”). Referring to FIGS. 12and 13, electrostatic potential diagrams for photodiode 260 (a pinnedphotodiode in this example), transfer gate 251 and floating diffusion262 are shown below their corresponding schematic cross-sectiondiagrams. Note that the depicted levels of electrostatic potential arenot intended to be an accurate representation of the levels produced inan actual or simulated device, but rather a general (or conceptual)representation to illustrate the operation of the pixel read-out phases.Upon application of VTG_(partial) to transfer gate 251, a relativelyshallow channel potential 271 is formed between photodiode 260 andfloating diffusion 262. In the example of FIG. 12, the level of chargeaccumulated within the photodiode at the time of the overthresholddetection operation (phase 4) does not rise to the threshold levelrequired for charge to spill over (i.e., be transferred) to the floatingdiffusion via the shallow channel potential of the partially-on transfergate. Accordingly, because the accumulated charge level does not exceedthe spillover threshold established by application of VTG_(partial) tothe control node of transfer gate 251, there is no spillover from thephotodiode to the floating diffusion and the accumulated charge insteadremains undisturbed within the photodiode. By contrast, in the exampleof FIG. 13, the higher level of accumulated charge does exceed thespillover threshold so that a portion of the accumulated charge (i.e.,that subset of charge carriers that are above the transfer gatepartially-on electrostatic potential) spills over into floatingdiffusion node 262, with the residual accumulated charge remainingwithin the photodiode as shown at 272.

Still referring to FIGS. 11, 12 and 13, prior to conclusion ofoverthreshold detection phase 4, the charge level of the floatingdiffusion is sampled and held within a signal-state sample-and-holdelement (i.e., in response to assertion of signal SHS) to yield athreshold-test sample—the difference between the signal-state sample andthe previously obtained reset-state sample—to be evaluated with respectto a conditional-reset threshold. In one embodiment, theconditional-reset threshold is an analog threshold (e.g., to be comparedwith the threshold-test sample in a sense amplifier in response toassertion of a compare/convert strobe signal) set or programmed to asetting above the sampling noise floor, but low enough to enabledetection of minute charge spillover via the shallow transfer gatechannel. Alternatively, the threshold-test sample may be digitized inresponse to assertion of the compare/convert signal (e.g., within ananalog-to-digital converter that is also used to generate the finalizedpixel sample value) and then compared with a digital conditional-resetthreshold, again, set (or programmed to a setting) above the noisefloor, but low enough to enable detection of trace charge spillover. Ineither case, if the threshold-test sample indicates that no detectablespillover occurred (i.e., threshold-test sample value is less thanconditional-reset spillover threshold), then the photodiode is deemed tobe in the underthreshold state shown in FIG. 12 and the TGc line is heldlow in the ensuing conditional read-out phase (phase 5, the final phase)to disable transfer gate 251 for the remainder of the progressiveread-out operation—in effect, disabling further read-out from thephotodiode and thus enabling the photodiode to continue integratingcharge without disruption for at least another sampling interval. Bycontrast, if the threshold-test sample indicates a spillover event(i.e., threshold-test sample greater than conditional-reset/spilloverthreshold), then the TGc line is pulsed during the conditional read-outphase concurrently with application of a fully-on, “remainder-transfer”potential, VTG_(full), to the TGr line, thereby enabling the remainderof the charge (i.e., charge 272 as shown in FIG. 13) within photodiode260 to be transferred to floating diffusion 262 via the full-depthtransfer-gate channel (273) so that, between the overthreshold transferin phase 4 and the remainder transfer in phase 5, the charge accumulatedwithin the photodiode since the hard reset in phase 1 is fullytransferred to the floating diffusion where it may be sensed in a pixelread-out operation. In the embodiment shown, the pixel-readout operationis effected by pulsing the SHS signal and compare/convert strobe insequence during conditional read-out phase 5, though either or both ofthose pulses may optionally be suppressed in absence of an overthresholddetection. Note that conditional read-out of the photodiode (i.e.,effected by pulsing TGc in conjunction with application of VTG_(full) onTGr) effectively resets the photodiode (i.e., drawing off all charge tothe floating diffusion), while suppression of the conditional read-outleaves the integration state of the photodiode undisturbed. Accordingly,execution of the conditional read-out operation in phase 5 conditionallyresets the photodiode in preparation for integration anew in thesucceeding sampling interval (subframe) or refrains from resetting thephotodiode to enable cumulative integration in the subsequent samplinginterval. Thus, in either case, a new integration phase follows phase 5,with phases 2-5 being repeated for each subframe of the overall frame(or exposure) interval, before repeating the hard reset in a new frame.In other embodiments, where cumulative integration is permitted acrossframe boundaries, the hard reset operation may be executed to initializethe image sensor and omitted for an indeterminate period of timethereafter.

FIG. 14 illustrates an embodiment of an image sensor 300 having aprogressive-readout pixel array 301, sequencing logic 303, rowdecoder/driver 305 and column read-out circuit 307. While pixel array301 is shown to include four rows and two columns of shared-elementpixels, other embodiments may include many more pixel rows and columnsto implement, for example, a multi-megapixel or gigapixel image sensor.The column read-out circuit 307 (for which two columns of read-outcircuitry are depicted) and row decoder/driver 305 may likewise bescaled to meet the number of pixels in the pixel array.

In the embodiment shown, each column of the pixel array is populated byshared-element pixels in which every four pixels form a quad pixel cell310 and contain respective photodiodes 260 (PD1-PD4), transfer gates251, and transfer-enable transistors 253, but share a floating diffusionnode 312, reset transistor 259, source follower 255 and row-selecttransistor 257. By this arrangement, the average transistor count perpixel is 2.75 (i.e., 11 transistors/4 pixels), thus effecting arelatively efficient, 2.75 T-pixel image sensor.

As shown, row decoder/driver 305 outputs a shared row-select signal (RS)and reset-gate signal (RG) to each row of quad-pixel cells 310, andoutputs independent row transfer-gate control signals (TGr1-TGr4) todrain terminals of respective transfer-enable transistors 253. In anembodiment in which row decoder/driver 305 sequences incrementallythrough the rows of the array (e.g., pipelining reset, integration andprogressive read-out operations with respect to the rows of pixel array301 such that one row is read-out after another), the row decoder/drivermay include logic to assert the RG, RS and TGr signals at theappropriate time for each row (e.g., synthesizing those signals withrespect to a row clock from sequencing logic 303). Alternatively, rowdecoder/driver 305 may receive individual timing signals correspondingto each or any of the RG, RS and TGr signals, multiplexing anyindividual enable pulse onto the corresponding RG, RS, or TGr lines of aselected row at the appropriate time. In one embodiment, the rowdecoder/driver receives transfer-gate control voltages corresponding tothe off, partially-on and fully-on states shown in FIGS. 11, 12 and 13(i.e., VTG_(off), VTG_(partial), VTG_(full)) from an on-chip or off-chipprogrammable voltage source 309, switchably coupling each of thedifferent control voltages to a given transfer-gate row line at adeterministic time, for example, as shown in FIG. 11. In alternativeembodiments, more than one voltage source 309 may be provided withinimage sensor 300 to enable transfer-gate control voltages to be locallycalibrated and thus compensate for control-voltage and/or performancevariations (i.e., non-uniformity) across the pixel array.

Still referring to the embodiment of FIG. 14, column read-out circuit307 includes a bank of read-out circuits 315, each implementing adigital threshold comparator and a relatively low bit-depthanalog-to-digital converter (e.g., a 4-10 bit ADC, though lower orhigher bit depth ADCs may be employed) to execute the overthresholddetection and conditional sampling operations, respectively, discussedin connection with FIGS. 11-13. In one implementation, the thresholdcomparator and ADC are implemented by separate circuits so that thepixel sample value may be generated without regard to theconditional-reset threshold applied in the overthreshold determination.Through this approach, the conditional-reset threshold is dissociatedfrom the reference signals (“ADC Vrefs”) used in the ADC conversion,freeing the conditional-reset threshold and ADC reference voltages to beindependently adjusted (e.g., through reprogramming athreshold-reference generator) dynamically during or prior to sensoroperation to achieve calibration and/or compensate for changingoperating conditions or sub-optimal imaging results. In an alternativeembodiment, the threshold comparator may be implemented as part of theADC (e.g., using a reference applied in connection with resolving thedigital sample value as the conditional-reset threshold), potentiallyreducing the footprint of the column read-out logic through more compactcircuit design.

In the embodiment shown, the sequencing logic delivers a column clock,sample-and-hold strobes (SHR, SHS, which are applied to enable signalstorage within sample-and-hold elements at the front-end of theADC/threshold comparator), and compare/convert strobe to the columnread-out logic to enable the operational timing shown, for example, inFIG. 11. That is, during the overthreshold detection phase (i.e., phase3), the read-out circuit for a given pixel column asserts (or maintainsassertion of) the TGc line (e.g., in response to assertion of a TGcEnsignal from sequencing logic 303 and logic OR gate 316) so that, whenthe row decoder/driver switches the TGr line for a given pixel row tothe partially-on potential (e.g., VTG_(partial), which is applied to thetransfer gates of the pixel row), execution of the overthresholddetection operation described above is enabled. Accordingly, thethreshold comparator within each read-out circuit evaluates the state ofthe threshold-test sample (which is generated according to the state ofshared floating diffusion 312 following application of VTG_(partial) tothe transfer gate of a given photodiode) with respect to theconditional-reset threshold to yield a binary overthreshold result. Ifan overthreshold condition is detected, the read-out circuit raises theTGc signal again a short time later (i.e., in conjunction with thefully-on TGr potential (VTG_(full)) to effect a conditional read-outoperation, enabling a full read-out of the photodiode state onto Voutand resetting the photodiode) and executes an analog-to-digitalconversion operation in response to assertion of the compare/convertstrobe to yield a digitized pixel sample.

Read-Out Circuitry

FIGS. 15A-15C illustrate alternative column read-out circuit embodimentsthat may be employed in connection with the exemplary progressiveread-out pixels described above. FIG. 15A, for example, illustrates acolumn read-out circuit 350 formed by sample-and-hold bank 351,analog-to-digital converter (ADC) 353, sense amplifier 355 andADC-enable gate 357. Sample-and-hold (S/H) bank 351 includes switchelements and analog storage elements (e.g., capacitive elements) toenable the reset-state and signal-state of a selected pixel (deliveredvia column “Vout” line) to be sampled and held in response to assertionof reset-state and signal-state control signals. In one embodiment, thepixel reset-state and signal-state signals are output differentially(e.g., signal-state—reset-state) from S/H bank 351, thus enabling senseamplifier 355 and ADC 353 to receive measurement signals that reflectthe state of the floating diffusion less a variable (i.e., noisy) resetlevel. In the embodiment shown, sense amplifier 355 and ADC 353 receiveseparate reference signals (“SA Ref” and “ADC Refs”) for application inoverthreshold detection and ADC operations, respectively. Morespecifically, when a compare-strobe signal (“Compare”) is pulsed, athreshold comparison is triggered within sense amplifier 353, yielding alogic high or low comparison result according to whether the S/H signaloutput (and thus the noise-corrected pixel signal-state) exceeds thesense-amp reference signal (i.e., a spillover threshold orconditional-reset threshold as described above). The comparison resultis fed back to the pixel column as the conditional-reset signaldiscussed above, and is also supplied to logic gate 357 to selectivelyenable an analog-to-digital conversion operation within ADC 353. Thatis, if sense amplifier 355 signals an overthreshold condition (a logic‘1’ comparison result in this example), then an ensuing convert-strobepulse (“Convert”) is enabled to pass through logic AND gate 357 (i.e.,by virtue of the high sense-amp output) to a convert-enable input of ADC353, thereby triggering the ADC operation. In one embodiment, a buffer359 is provided to store the resulting N-bit ADC value (e.g., an 8-bitto 12-bit value in a number of embodiments, though higher or lowerresolutions may apply in all cases), as well as the comparison resultfrom sense amplifier 355, the latter forming a validity bit “V” thatqualifies ADC content within buffer 359 as containing valid or non-validdata. Accordingly, if no detectable spillover has occurred within thepixel being read-out, the logic-low comparison result will not onlysuppress the ADC operation (saving power), but also qualify the contentof the read-out buffer, thereby permitting compression of the outgoingdata stream. This result is indicated in the timing waveform at 360 bythe dashed ADC data transmission—showing generation and transmission ofADC data only if the pixel measurement exceeds the spillover threshold(V=1).

FIG. 15B illustrates an alternative read-out circuit embodiment 365 thatlacks a sense amplifier and instead applies ADC circuit 353 to performboth the threshold comparison and, if necessary, generation of ADC datacorresponding to full pixel read-out. As before, S/H bank 351 outputs ameasurement signal that reflects the difference between the signal-stateand reset state during spillover (partial read-out) and full read-outoperations. A compare-strobe (“Compare”), when asserted, is applied vialogic OR gate 368 to an enable-convert input of the ADC to enable an ADCoperation with respect to the measurement signal acquired during apartial-read operation (i.e., application of VTG_(partial) to thetransfer gate of a selected pixel as discussed above). If the ADC outputexceeds a digital threshold value (i.e., a multi-bit digital value ordigital number), comparator 367 asserts aconditional-reset/overthreshold signal (e.g., to a logic ‘1’ state inthe example shown), thereby enabling an ensuing convert-strobe pulse(“Convert”) to pass through logic AND gate 369 (and logic OR gate 368)to trigger another ADC operation, this time with respect to ameasurement signal acquired during a full read-out operation. As in theembodiment of FIG. 15A, the conditional-reset signal is driven back tothe pixel column to enable the full-read (and pixel reset) operationwithin the subject pixel, and is also output to read-out buffer 359 tobe stored as a validity bit, qualifying the corresponding ADC datacontent of that buffer. Although the compare-strobe, convert-strobe andtransmit-data waveforms in the embodiment of FIG. 15B (i.e., shown at370) are illustrated as matching those in FIG. 15A, a somewhat largerdelay may be imposed between the compare-strobe and convert-strobepulses to account for the additional time required within ADC todigitize the S/H partial-read measurement. In both cases, the intervalbetween the compare-strobe and convert-strobe pulses may be differentfrom the intervals shown, for example, to align the read-out timingoperations with the pixel operations described above (e.g., as shown inFIG. 11).

FIG. 15C illustrates a variation (375) of the read-out circuitembodiment of FIG. 15B. In general, the sequence of read-out operationsis as discussed in reference to FIG. 15B except that the partial-readADC output is latched within read-out buffer 377 and, if underthreshold(i.e., no conditional reset and thus no subsequent full-read ADCoutput), the digitized partial-read measurement is transmitted off chiptogether with an overthreshold bit (OT) that indicates whether theoverthreshold condition has been detected. If the partial-read ADCoutput exceeds the spillover threshold, then the full-read measurementis digitized in a second ADC operation and stored within the read-outbuffer, overwriting the partial-read ADC value. By this operation, avalid pixel read-out value, reflecting either a partial read-out (OT=0)or a full read-out (OT=1) is transmitted to an external destinationregardless of whether the spillover threshold is exceeded, thuspermitting a sequence of partial-readout values to be accumulated(integrated) within the final pixel value. Note that storage andtransmission of the OT bit may be omitted, particularly in embodimentsin which ADC measurements are aggregated or otherwise combined withoutregard to whether their acquisition occurred in a full or a partialread-out operation.

Image Decimation and Pixel Binning

A number of conditional-reset image sensor embodiments described hereinare operable in decimation modes that yield less than maximum imageresolution. For example, in one embodiment an image sensor capable ofgenerating an 8 MP (8 megapixel) output in a still-image mode, yields a2 MP output in a decimated, high-definition (HD) video mode; a 4:1decimation ratio (higher or lower resolutions may apply in each mode,and other decimation modes and ratios may be achieved in alternativeembodiments; also, if the still and video frame aspect ratios differ,some areas of the sensor may not be used at all in one or the othermodes).

While post-digitization logic may be provided to decimatefull-resolution data (e.g., on-chip logic at the output of the ADC bankor off-chip processing logic), pixel charge aggregation or “binning”within the pixel array and/or voltage binning within sample-and-holdstorage elements is applied in a number of embodiments to effectpre-digitization (i.e., pre-ADC and thus analog) decimation, obviatingdie-consuming and power-consuming digital binning logic and, in manycases, yielding improved signal-to-noise ratio in the decimated output.

FIG. 16 illustrates a quad-pixel, shared floating diffusion image sensorarchitecture in which the row and column transfer-gate control lines(TGr and TGc) disclosed in the embodiments above are applied in a mannerthat enables multiple decimation modes without requiring additionalarray-traversing control lines. More specifically, by centralizing ashared floating diffusion 401 between four pixels (each including arespective photodiode, PD1-PD4, and transfer-enable transistor,403.1-403.4, and transfer gate, 404.1-404.4) and splitting the columntransfer-gate control line TGc into separate odd and even column-enablelines (TGc1 and TGc2, each coupled to a respective logic OR column-linedriver 421, 423), it becomes possible to charge-bin all or any subset ofthe pixels in a decimation mode and also to operate and read-out eachpixel individually a non-decimated (full-resolution) mode.

In the particular embodiment shown, the shared floating diffusion 401(illustrated in two interconnected parts for drawing simplicity) isswitchably coupled to photodiodes PD1-PD4 of the four pixels throughrespective transfer gates 404.1-404.4, with each transfer gatecontrolled by a different pair of TGr and TGc signals within the controlsignal matrix. That is, transfer gate 404.1 is controlled bytransfer-enable transistor 403.1 via control signals TGr1/TGc1, transfergate 404.2 is controlled by transfer-enable transistor 403.2 via controlsignals TGr2/TGc1, transfer gate 404.3 is controlled by transfer-enabletransistor 403.3 via control signals TGr1/TGc2 and transfer gate 404.4is controlled by transfer-enable transistor 403.4 via control signalsTGr2/TGc2. As in the shared-element pixel arrangements described above,the shared floating diffusion 401 is coupled to a shared source follower405, row-select transistor 407 and reset transistor 409, thus enabling amore compact quad-pixel layout. Moreover, as shown in the exemplaryphysical-layout diagram of FIG. 17, the four transfer gates (“TG”) maybe physically disposed at the corners of a centralized floatingdiffusion (FD) with transfer-enable transistors, reset gate, sourcefollower and row-select transistors formed at the periphery of thequad-pixel layout, thus effecting a highly compact quad-pixel footprintthat may be repeated in row and column dimensions across amulti-megapixel array.

FIGS. 18A and 18B illustrate color filter array (CFA) patterns that maybe employed with respect to the quad-pixel architecture of FIGS. 16 and17 and that may dictate practical decimation modes. In the CFA patternof FIG. 18A, for example, the green corner pixels (G) that includephotodiodes PD1 and PD4 (i.e., PD1 and PD4 are disposed beneath greencolor filter elements) may be binned in a 4:3 charge-binning decimationmode, while in the CFA pattern of FIG. 18B, which includes, white,green, red and blue color filters, both pairs of corner pixels in eachquad-pixel (i.e., the pixels that photodiodes PD1 and PD4, and thepixels that include photodiodes PD2 and PD3) may be charge-binned in a4:2 decimation mode. Other charge-binning arrangements may be employedwith respect to other CFA patterns and/or black and white (or grayscale)imaging.

FIGS. 19 and 20 present timing diagrams illustrating exemplary phases offull-resolution (non-binning) and binned-mode pixel read-out operations,respectively, within an image sensor containing the 2×2 quad-pixelarrangement shown in FIG. 16. For purposes of example, differentread-out gain configurations are assumed during partial read-out(threshold testing) and full-read out operations within each of thetiming diagrams, with separate sets of sample and hold elements beingapplied to capture reset-state and signal-state samples during thoseread-out operations. Examples of different gain configuration circuitsand their benefits are described below in reference to FIGS. 25A-25C, 26and 27.

Turning first to the full-resolution read-out of FIG. 19, a resetoperation is performed in phase 1 (delineated at the bottom of thetiming diagram) by fully asserting the transfer-gate row signal as shownat 420 for the row being read-out (TGri), together with the odd and eventransfer-gate column signals (TGc1, TGc2), thereby applying the fullread-out potential to the transfer gates for the even and odd columnswithin the selected row to enable charge transfer from the correspondingphotodiodes to the shared floating diffusion (i.e., resetting thephotodiodes to an initial state in preparation for charge integration).After lowering the TGri signal, the reset-enable signal (RG) is pulsedat 422 to switch on the reset transistor and thus reset the floatingdiffusion. During integration phase 2 (duration not shown to scale),charge is integrated/accumulated within the photodiodes according to theintensity of the incoming light. During odd-column threshold-testingphase 3 a, the RG signal is pulsed a second time at 424 to reset thefloating diffusion, and reset-state sample-and-hold signals SHRsa andSHRadc are pulsed at 426 and 428 while row-select line RSi is high toenable the reset-state of the floating diffusion to be sampled withinthe sample-and-hold elements for the sense amplifier and ADC,respectively. After the reset-state of the floating diffusion issampled, the even column transfer-gate signal (TGc2) is lowered (whileTGc1 is held high) and TGri is raised to the VTG_(partial) potential toenable a threshold-test read-out with respect to the odd-column pixel.At 430, a signal-state sample-and-hold signal, SHSsa, is raised toenable a sample of the floating diffusion state (i.e., any spillovercharge therein) to be captured within a sample-and-hold element for thesense-amplifier, and, at 432, the compare-strobe signal (“Compare”) ispulsed to enable the sense amplifier component of the read-out circuitto generate a comparison result between the floating diffusion signalstate (less the reset state) and the conditional-reset (spillover)threshold.

The odd-column transfer-gate signal (TGc1) is lowered following captureof the floating diffusion signal-state at 432 and prior to raising therow transfer-gate signal to the fully-on (VTG_(full)) potential inodd-pixel, conditional read-out phase 4 a. More specifically, if thecomparison result indicates an underthreshold condition, the TGc1 lineis held low while TGri is raised to the VTG_(full) potential, therebysuppressing the full pixel read-out and allowing the charge integratedwithin the photodiode during integration phase 2 to remain undisturbedand serve as the initial state during a subsequent integration interval(i.e., continued integration). By contrast, if the sense-amp comparisonresult indicates an overthreshold condition (i.e., the chargeaccumulated during integration phase 2 exceeds the conditional-resetthreshold), then the TGc1 line is raised as shown by the dashed pulse at434 concurrently with application of the VTG_(full) potential on TGri,thereby applying VTG_(full) to the odd-pixel transfer gate to enable afull pixel read-out operation. Shortly thereafter, just prior to theconclusion of the odd-pixel conditional read-out, signal-statesample-and-hold signal SHSadc is pulsed (as shown at 436) to capture asample of the odd-pixel read-out signal within the signal-statesample-and-hold element for the ADC. At 438, after capturing theodd-pixel read-out signal in the ADC sample-and-hold element, theconvert-strobe is pulsed to trigger an ADC operation with respect to thedifferential between the reset-state and signal-state samples capturedwithin the ADC sample-and-hold elements.

At the conclusion of the odd-pixel conditional read-out (i.e., phase 4a), the row transfer-gate signal is lowered so that, in the ensuingeven-pixel threshold testing phase 3 b, assertion of the odd-pixelcolumn transfer-gate signal TGc1 at 440 drives the odd-pixel transfergate low (ensuring isolation between the photodiode and floatingdiffusion), thus enabling the floating diffusion to be reset by the RGpulse at 442 without disturbing the odd-column pixel state. Still inphase 3 b, the even-column transfer gate signal is raised at 446concurrently with assertion of the SHRsa pulse at 448 to acquire areset-state sample of the floating diffusion. As in the odd-pixelthreshold test, the row transfer-gate signal TGri is raised to thepartially-on potential (VTGpartial) at 450 (while TGc2 remains high),thereby enabling charge spillover from the even-pixel photodiode to thefloating diffusion if an overthreshold condition exists within thephotodiode. At 452, SHSsa is pulsed to sample the even-pixelsignal-state and the compare-strobe is pulsed at 454 to enable aneven-pixel overthreshold determination (even-pixel signal-state lessfloating diffusion reset-state) within the read-out sense-amplifier. Aswith the odd-pixel, if the comparison result from the sense amplifierindicates an overthreshold condition, the even-pixel column transfergate signal is asserted at 456 concurrently with elevation of the TGripotential to the fully-on level (VTG_(full)), thus enabling a fullread-out of the even-pixel signal state followed by assertion of theSHSadc and convert-strobe signals (at 458 and 460, respectively) toyield an even-pixel ADC result. If the comparison result from the senseamplifier indicates an underthreshold condition, the TGc2 pulse at 456is suppressed to avoid disturbing the state of the even-pixelphotodiode, thus leaving the charge on the photodiode intact forcontinued integration.

Still referring to FIG. 19, in data-transfer phase 5, the row-i ADCvalues for the even and odd pixels are transmitted (e.g., to an off-chipimage processing destination) one after another to an on-chip oroff-chip image processing destination. As discussed above, in the caseof an underthreshold condition with respect to a given pixel,analog-to-digital conversion with respect to that pixel may besuppressed and/or the ADC output omitted from the outgoing data stream.In any case, data transmission with respect to a selected pixel row maybe pipelined with pixel read-out operations within subsequent rows asshown, for example, by the transmission of row i−1 data concurrentlywith phases of the read-out operation with respect to row i pixels.

In the binned-mode read-out timing diagram of FIG. 20, hard-reset andintegration operations (phases 1 and 2) are executed as described abovein reference to FIG. 19, as is the floating diffusion reset (i.e.,asserting RG while TGc1 and TGc2 are high, and sampling the reset-statein response to assertion of the SHRsa and SHRadc signals) at the startof threshold-testing phase 3. Thereafter, partial read-out operationsare executed one after another with respect to corner pixels (i.e.,containing photodiodes PD1 and PD4, in the example shown), by drivingTGr1 to the partially-on state at 476 concurrently with assertion ofTGc1 and deassertion of TGc2, and then driving TGr2 to the partially-onstate at 478 concurrently with assertion of TGc2 and deassertion ofTGc1. By this operation, any spillover charge from photodiodes PD1 andPD4 is aggregated in the floating diffusion and thus captured within thesense amp sample-and-hold element when SHSsa is asserted at 480.Accordingly, assertion of the compare-strobe signal at 482 enables acomparison of the aggregated the spillover charge from PD1 and PD4 (lessthe reset-state of the floating diffusion) and the conditionalreset/conditional read-out threshold. If the comparison result indicatesan overthreshold condition, TGc1 and TGc2 are pulsed one after anotherat 484 and 486 (and each concurrently with assertion of the VTG_(full)potential on corresponding row lines TGr1 and TGr2, respectively) toenable the remainder of the charge accumulated within the cornerphotodiodes (PD1 and PD4) to be transferred to the floating diffusion,charge binning the pixel integration results and resetting each pixel inpreparation for the next charge integration interval. Accordingly, whenthe SHSadc signal is pulsed at 488, the photodiode charge binned (oraggregated) within the floating diffusion is captured within thesignal-state sample and hold element for the ADC, thus enabling an ADCoperation with respect to the combined charge from the corner pixels(less the floating diffusion reset state) when the convert-strobe ispulsed at 490. The resulting digitized pixel value (i.e. ADC output) forrow i may be transmitted to off-chip or on-chip processing logic duringread-out of the following pair of pixel rows.

Still referring to FIG. 20, if the comparison result output by theread-out sense amplifier indicates an underthreshold condition, the TGc1and TGc2 signal assertions shown at 484 and 486 are suppressed to avoiddisturbing the contents of the subject photodiodes, thereby permittingcontinued integration during a subsequent subframe interval. While thetiming sequence shown yields the output of binned results from thecorner pixels containing photodiodes PD1 and PD4 (i.e., northwest andsoutheast corners in the layout shown in FIGS. 16 and 18), the waveformsoutput onto signal lines TGc1 and TGc2 may be swapped to yield binnedresults from corner pixels containing photodiodes PD2 and PD3. Further,read-out of the aggregated (binned) charge within all four photodiodesmay be effected by performing additional partial-read operations inphase 3 (i.e., repeating the TGr1, TGr2 partial-on pulses, but reversingthe assertion sequence of column transfer gate signals TGc1 and TGc2 toeffect partial-reads of photodiodes PD2 and PD3), and then, if anoverthreshold result is detected, performing additional full read-outoperations in phase 4 (i.e., repeating the TGr1 and TGr2 fully-onpulses, but reversing the assertion sequence of column transfer gatesignals TGc1 and TGc2).

FIG. 21 illustrates an alternative binning strategy that may be executedwith respect to a collection of 4×1 quad-pixel blocks 310 and the colorfilter array (CFA) fragment shown at 500. In the embodiment shown, eachquad pixel block 310 (shown at 310.1-310-4 with respect to the CFAfragment) is implemented generally as described in reference to FIG. 14and may be read-out according to any of the read-out techniquesdescribed in reference to FIGS. 14 and 15A-15C. As shown, CFA fragment500 (i.e., a sufficient portion of a sensor-wide CFA to demonstrate theCFA pattern) includes collections of like colored filter elements at thecorner pixels of each 3×3 pixel group. Thus, green filter elements aredisposed over shaded pixels ‘G’, blue filter elements are disposed overstriped pixels ‘B’ and red filter elements are disposed over hashedpixels ‘R’. In this arrangement, each pair of like-filtered pixels(i.e., subject to light filtered by same-color filter elements, R, G orB) disposed in the same quad-pixel block thus permit charge binningwithin their shared floating diffusion as detailed below. Further,referring to FIG. 22, by fixing column offset between the pixel pairwithin each column and the like-filtered pair of pixels coupled to thesame row lines (i.e., fixed at a spacing of two columns in the exampleshown) and by providing switching elements at the column read-out pointsof pixel array 551 (i.e., switching elements 561 and 562 withinsample-and-hold circuitry 553), it becomes possible to “voltage-bin” theresults of the two charge-binned pixel pairs within sample-and-holdcircuitry 553, thus combining (i.e., aggregating, binning) the fourcorner pixels in each 3×3 pixel group prior to digitization within theADC elements of SA/ADC block 555.

FIG. 23 illustrates an exemplary timing diagram of binned-mode read-outoperations within the 4×1 quad-pixel architecture of FIGS. 21 and 22. Inthe example shown, row lines for pixel rows i and i+2 are operated inlock step to achieve 2:1 charge binning within the shared floatingdiffusion of a given quad-pixel block. More specifically, row signalsfor pixel rows 1 and 3 of a 4×1 quad pixel block (or row of such quadpixel blocks) are asserted in unison, followed by locked-step assertionof row signals for pixel rows 2 and 4, before advancing to assert rowsignals for the next row of 4×1 quad pixel blocks. Transverseconnections are established within sample-and-hold switch elements(e.g., at 561 and 562 of sample-and-hold block 553 as shown in FIG. 22)to achieve 2:1 voltage binning and thus an overall 4:1 analog signalsumming and concomitant image decimation.

Referring more specifically to FIG. 23, the row-select signals (RS),reset-gate signals (RG) and row transfer-gate signals (TGr1, TGr3 or“TGr1,3”) are operated in lock step to reset the photodiodes and sharedfloating diffusion of the selected pixel rows during hard-reset phase 1,permit charge integration during integration phase 2, determine whetherthe charge-binned and voltage-binned charge-accumulation results withineach column-interleaved collection of four pixels (i.e., the 3×3 cornerpixels as described in reference to FIGS. 21 and 22) exceed theconditional-reset threshold in threshold-test phase 3, and, if anoverthreshold condition is detected, conditionally read-out and digitizethe full charge-binned and voltage-binned accumulated charge within thesubject pixel collections in conditional read-out phase 4 beforetransmitting the digitized pixel value to downstream (on-chip oroff-chip) processing logic in output phase 5. Considering the phases oneby one, during hard-reset phase 1, the row-transfer gate signals TGr1and TGr3 are pulsed to VTG_(full) (as shown at 570) while simultaneouslyraising column transfer-gate signal TGc, thus transferring accumulatedcharge from photodiodes PD1 and PD3 to their shared floating diffusionnode. After the photodiode-to-floating-diffusion charge transfer, resetsignal RG is pulsed at 572 to clear charge from the floating diffusionin preparation for the ensuing charge integration in phase 2. At thestart of threshold-test phase 3, the reset signal is pulsed again (574)to reset the floating diffusion and then signals SHRsa and SHRadc arepulsed at 576 and 578 (while RSi is asserted) to capture samples of thereset-state of the floating diffusion within the sample-and-holdelements for the sense amplifier and ADC. At 580, TGr1 and TGr3 areraised to the partial-on transfer potential, VTG_(partial), to enablecharge spillover to the shared floating diffusion if an overthresholdcondition exists in the photodiodes of the subject pixels. The SHSsasignal is then pulsed at 582 while the transverse-interconnect switchelements (e.g., transistors) are switched to a conducting state withinthe sample and hold bank to capture the signal-state of the floatingdiffusion nodes within related columns (i.e., column j and column j+2 inthe embodiment shown) within a shared sample-and-hold element, thusvoltage binning the two charge-binned spillover samples. Thethreshold-test phase is concluded by lowering the TGc signal andasserting the compare-strobe (584) to trigger a threshold comparisonwithin the sense amplifier, comparing the aggregated spillover chargefrom the four charge/voltage binned pixels against a conditional-resetthreshold. If the comparison result indicates an overthresholdcondition, the TGc signal is pulsed at 586 during application ofVTG_(full) on the TGr1 and TGr3 lines, (thus enabling a full read-out ofphotodiodes PD1 and PD3 to the shared floating diffusion withincorresponding quad pixel block), and then the SHSadc signal is raised at588 to capture the signal-state of the floating diffusion nodes ofswitch-interconnected pixel columns within a signal-statesample-and-hold element for the ADC (i.e., voltage-binning thecharge-binned floating diffusion contents). Thereafter, theconvert-strobe is pulsed at 590 to trigger an ADC operation with respectto the voltage/charge-binned signal state captured within thesample-and-hold circuit (if any), followed by transmission of the ADCoutput in phase 5. As discussed above, the ADC operation and datatransmission operations may be suppressed to save power and reducesignaling bandwidth if an overthreshold condition is not detected inthreshold-test phase 4.

FIG. 24 illustrates a more detailed embodiment of an image sensor 600having an array of 4×1 quad pixel blocks 601 operable in the decimation(binning) mode described in reference to FIGS. 21-23. As in theembodiment of FIG. 14, a row decoder/driver 605 receives transfer gatevoltages (e.g., VTG_(partial), VTG_(full) and VTG_(off)) from an on-chipor off-chip voltage source 309 and a row address value and row clock(used to control row signal timing) from sequencing logic 603,outputting row control signals, RG, RS and TGr1-TGr4 in response.Sequencing logic additionally outputs a set of read-out control signalsto column read-out circuitry 607, including a column clock signal (whichmay be composed of multiple timing/control signals for timing operationswithin the sense amplifiers, ADCs, memory buffers, etc. with columnread-out circuitry 607), compare-strobe and convert-strobe signals asdescribed above, the column transfer-gate enable signal (TGcEn), SHR andSHS signals (which may include separate signals for sense amp and ADCsample-and-hold elements). Sequencing logic also outputs adecimation-mode signal (“Dec Mode”) to both column read-out circuitry607 and row decoder/driver 605 to enable/disable the above-describedcharge and voltage binning operations. For example, in one embodiment,the decimation mode signal is configurable in one of at least twopossible states (e.g., according to a decimation mode setting within aprogrammable configuration register 604), including a binning-disabledstate in which pixel rows and columns are operated individually toenable full-resolution image read-out, and a bin-enable state in whichthe row decoder/driver asserts row signal pairs (e.g., TGr1/TGr3 andthen TGr2/TGr4) in locked-step to achieve charge binning within theshared floating diffusion, and in which column read-out lines (Vout) foreven and odd column pairs are transversely coupled (e.g., as shown inFIG. 22) to enable voltage binning within sample-and-hold elements.

Still referring to the embodiment of FIG. 24, column read-out circuitry607 includes, in addition to sense amplifiers 617 and TGc logic gates619 (which operate generally as described above), a set of columneclipse detect circuits 615, each coupled to receive a pixel resetsignal from sample-and-hold block 609 ,and having circuitry to determinewhether the photodiode measurement (whether binned or at fullresolution) exceeds a saturation threshold. If a given eclipse-detector615 (e.g., implemented by a threshold comparator) detects a saturationcondition (i.e., saturation threshold exceeded), the eclipse detectorraises an eclipse signal at a secondary enable input of ADC circuit 611to disable ADC operation therein. The eclipse signal is also output to aline memory element 621 to qualify the ADC output, being recordedtherein as a logic ‘1’ eclipse bit if a saturation condition wasdetected (thus indicating that the ADC output is invalid and in factshould be represented by a maximum read-out value) and a logic ‘0’eclipse bit otherwise. By this operation, the eclipse bit andunderthreshold bit recorded for each pixel column serve jointly toqualify the corresponding ADC output as follows (where ‘X’ indicates adon't care status):

TABLE 1 Under- ADC threshold Eclipse Value Interpretation 0 0 InvalidUnderthreshold: ADC output assumed to be 0 X 1 Invalid Saturation:, ADCoutput assumed to be all ‘1’s 1 0 Valid Overthreshold without Saturating

Still referring to FIG. 24, when the binning mode is set to enablevoltage binning between column pairs (e.g., even numbered columnsvoltage binned and odd-numbered columns voltage binned), the senseamplifier and ADC within one column in each binned column pair may bedisabled to save power, with the transmitted data stream decimatedaccording to the binning mode.

Dynamic-Gain Pixel Read-Out

As briefly mentioned in connection with FIGS. 19 and 20, different gainsmay be applied during partial and full read-out operations. That is,because the spillover charge during a partial read-out may beexceedingly small (i.e., where the charge integration level barelyexceeds the conditional-reset threshold), it may be beneficial to applya higher gain during the partial read-out. By contrast, because the fullread-out may range between minimum and maximum charge integrationlevels, a significantly lower gain may be applied to normalize thosecharge levels to the minimum and maximum ADC output values. Accordingly,in a number of embodiments herein (including those described above inreference to FIGS. 19-24), different gains are applied by the columnread-out circuitry during partial read-out and full read-out operations.

FIG. 25A illustrates an embodiment of a selectable-gain (or multi-gain)read-out circuit that may be used to effect a high-gain partial read-outand near-unity gain full read-out within a pixel column. Morespecifically, in the implementation shown, multiplexers 651 and 653 areused to establish either a common-source amplifier configuration(gain=transconductance of transistor M1*load resistance R_(L), where ‘*’denotes multiplication) or a source-follower configuration (unity gainor near-unity gain) according to the state of multiplexer controlsignals CS and SF. In the common-source amplifier configuration, (CS=1,SF=0), multiplexer 653 couples column line Col2 to voltage supply railVdd via load resistance R_(L) (655), while multiplexer 651 couplescolumn line Col1 to ground. As shown, Col2 is coupled to the drainterminal of row-select transistor 683 so that Vout1 will vary accordingto the current flow through transistor M1; a function of the appliedgate voltage (floating diffusion charge level) and transconductance ofthat transistor. More specifically, as can be understood from FIG. 25B(which illustrates the common source gain configuration), Vout1 is givenby Vdd−I_(M1)*R_(L) so that Vout1/V_(FD) is approximately g_(m)*RL,where g_(m) represents the transconductance of transistor M1.Accordingly, by appropriately sizing M1 and/or R_(L), a common-sourcegain substantially greater than unity may be achieved, thus improvingsensitivity to the relatively small level of charge that may spilloverto the floating diffusion during partial read-out operations. Note thatreset transistor 685 is also coupled to the Col2 line, thus enabling thefloating diffusion to be pulled up to CS mode Vout (i.e., reset) inresponse to RG signal assertion while in the common-source gainconfiguration.

In the source-follower configuration (SF=1, CS=0), multiplexer 653couples a current source 657 to the Col2 line, and multiplexer 651couples column line Col1 to Vdd, thus establishing M1 as asource-follower amplifier (i.e., output voltage at M1 source and thusVout2 follows the floating-diffusion voltage applied at the gate of M1)as shown at FIG. 25C. More specifically, in order to maintain asubstantially constant current through the Col2 line, the feedback loopthat maintains the constant current source raises the potential at Vout2as necessary to counteract any conductance change in transistor Ml.Accordingly, assuming a substantially linear transconductance within Ml,the current source raises and lowers Vout2 in a substantially linearcorrespondence to increase and decrease in the floating diffusionpotential, thus effecting substantially constant proportionality betweenVout2 and V_(FD). In the embodiment shown, the constant ofproportionality is slightly less than unity (e.g., 0.85 in the specificexample depicted, though other proportionality constants, includingunity, may be achieved in alternative embodiments or other programmedconfigurations) in the source follower configuration.

Still referring to FIG. 25A, separate sets of sample-and-hold elements(e.g., capacitive elements and switch elements) 669 and 671 are coupledto the Vout1 and Vout2 nodes, respectively, to accommodate the differentgain configurations applied during partial read-out and full read-outoperations, with correspondingly separate sets of reset-state andsignal-state sample-enable signals applied to the two sample-and-holdcircuits. In the example shown, the partial read-out sample-and-holdcircuit 669 (i.e., controlled by signals SRcs and SScs in thecommon-source gain configuration) provides a differential output (i.e.,signal-state sample less reset-state sample) to a sense amplifiercircuit 675, while the full read-out sample-and-hold circuit 671(controlled by signals SRsf and SSsf in the source-follower gainconfiguration) provides a differential output to ADC 677. As in allembodiments having both a sense amplifier and ADC, the sense amplifiermay be omitted and the ADC applied during both the partial and fullread-out operations as discussed in reference to FIGS. 15B and 15C. Insuch ADC-only implementations, the outputs of sample-and-hold circuits669 and 671 may be multiplexed to the input of ADC 677 according to thestate of the CS and SF signals. In an embodiment in which the CS and SFsignals always have complementary states, a single signal mayalternatively be used to switch between common-source andsource-follower gain configurations.

FIG. 26 presents an exemplary timing diagram illustrating thealternating application of common-source and source-follower gainconfigurations during hard-reset, integration, partial read-out and(conditional) full read-out operations within the multi-gainarchitecture of FIG. 25A. As shown, the common-source enable signal (CS)is asserted at 686 concurrently with the hard-reset RG pulse (i.e.,asserted in preparation for charge integration) and at 688 (floatingdiffusion reset in preparation for reset-state sampling). During atleast a portion of the charge integration interval, signal gain may bedisabled altogether to save power (i.e., lowering both the SF and CScontrol signals as shown), though in actuality one or both gain modesmay be applied during that interval to enable operations in other pixelrows. During reset-state sampling, the common-source and source-followergain configurations are enabled one after another as shown at 690 and692 (i.e., initially holding CS high while SF is low and then reversingthat configuration), with reset-state sampling signals SRcs and SRsfbeing pulsed at 694 and 696 while in the common-source andsource-follower gain configurations, respectively, to capturereset-state samples within the different sample-and-hold circuitsprovided for the two gain configurations. Thereafter, CS is raised at698 (and SF lowered) to apply the common-source gain configurationduring the partial read-out operation (effected by raising TGr to thepartially-on state at 700 while TGc is held high and concluding withassertion of the SScs and compare-strobe signals), and then SF is raisedat 702 (and CS lowered) to apply the source-follower gain configurationduring the ensuing conditional full read-out operation (effected byraising TGr to the full read-out potential at 704 concurrently withconditional pulsing of the TGc signal and concluding with assertion ofthe SSsf and convert-strobe signals).

Reflecting on the multi-gain architecture described in reference toFIGS. 25A-25C and FIG. 26, it should be noted that other gainconfigurations or combinations of gain configurations may be used inalternative embodiments. For example, as shown in FIG. 27, two differentcommon-source gain configurations, may be effected by coupling differentpull-up resistances (RL1 and RL2) to the col2 line via multiplexer 701,and thereafter selecting one gain or the other (i.e., throughappropriate assertion of control signals CS1 and CS2) generally asdescribed in reference to FIG. 26. In another embodiment, a programmablegain amplifier may be coupled to the Col2 and/or Col1 line and switchedbetween programmed settings to effect different partial read-out andfull read-out gains. More generally, any practicable configuration orarchitecture that enables adjustment of the gain applied during partialread-out and full read-out operations may be employed in alternativeembodiments.

Image Sensor Architecture, System Architecture

FIG. 28 illustrates an embodiment of an image sensor having a pixelarray 731 disposed between upper and lower read-out circuits 732.1 and732.2. The read-out circuits are coupled to respective halves of thepixel rows in the array and are operable in parallel, thereby halvingthe time required to scan through the rows of the pixel array. In oneembodiment, the pixel rows are allocated between the upper and lowerread-out circuits according to the physical half of the pixel array inwhich the pixel rows reside. For example, all upper pixel rows (i.e.,above a physical midpoint) may be coupled to the upper read-out circuit,and all lower pixel rows may be coupled to the lower read-out circuit,thereby reducing the overall column line length (reducing capacitance,noise, required drive power, etc. with respect to each Vout and resetfeedback (TGc) line). In other embodiments, the pixel rowinterconnections to the upper and lower read-out circuits may beinterleaved across the rows of pixel arrays, with the connectionalternating between upper and lower read-out circuits for eachsuccessive row of pixel blocks (e.g., every fourth row in a pixel arraypopulated by the 4×1 quad-pixel block shown in FIG. 21, or every secondrow in a pixel array populated by the 2×2 quad-pixel block shown inFIGS. 16 and 17, or every other row in a pixel array populated by pixelshaving dedicated Vout interconnects). In the embodiment shown, eachread-out circuit (732.1 and 732.2) includes a sample-and-hold bank 733(e.g., including per-column capacitive storage elements and switchingelements as described above), a sense amplifier bank 735 includingper-column sense amplifier circuits (or latches) and reset-feedbacklogic, a per-column ADC bank 737 and a digital line memory 739. Inembodiments that apply the per-column ADCs to digitize partial read-outsamples, the sense amplifier bank 735 may be omitted and the per-columnADC bank outfitted with digital comparators to generate reset-feedbacksignals (i.e., conditional-reset signals, TGc). Also, thesample-and-hold bank may include transverse switching elements asdescribed in reference to FIG. 22 to support voltage binning operations.More generally, the various circuit blocks of the upper and lowerread-out circuits may be operated and/or configured as described aboveto support various decimation modes and read-out options. Though notspecifically shown, the upper and lower digital line memories 739 mayfeed a shared physical output driver (PHY), for example, disposed to theleft or right of the pixel array and coupled to receive data in parallelfrom each of the digital line memories. Alternatively, separate PHYs maybe provided with respect to the two digital line memories, with the PHYsbeing disposed, for example, at an opposite edges of the image sensorIC. Further, while the upper and lower read-out circuits may beimplemented on the same physical die as pixel array 731 (e.g., at theperiphery of the die (sandwiching the pixel array) or in the center ofthe die between respective halves of the pixel array, the read-outcircuits may alternatively be located on another die (e.g., coupled tothe pixel array die in a stacked configuration that may additionallyinclude other imaging-related dies).

FIG. 29 illustrates an embodiment of an imaging system 800 having animage sensor 801, image processor 803, memory 805 and display 807. Theimage sensor 801 includes a pixel array 811 constituted bytemporally-oversampled conditional-reset pixels according to any of theembodiments disclosed herein, and also includes pixel control andread-out circuitry as described above, including row logic 815, columnlogic 817, line memory 819 and PHY 821. Image processor 803 (which maybe implemented as a system-on-chip or the like) includes an image signalprocessor (ISP) 831 and application processor 833, coupled to oneanother via one or more interconnect buses or links 836. As shown, ISP831 is coupled to receive imaging data from the pixel array via PHY 827(and signaling link(s) 822, which may be implemented, for example, by aMobile Industry Processor Interface (“MIPI” bus) or any otherpracticable signaling interface), and the ISP and application processorare coupled to a memory control interface 835 and user-interface port837 via interconnect 836. Further, as explained below, interconnect 836may also be coupled to the image sensor interface of ISP 831 (i.e., theISPs interface to PHY 827) via side-channel 838 to enable theapplication processor to deliver data to the ISP in a manner thatemulates an image sensor.

Still referring to FIG. 29, imaging system 800 further includes one ormore memory components 805 coupled to the memory control interface 835of image processor 803. In the example shown, and in the discussionbelow, the memory components are assumed to include a dynamic randomaccess memory (DRAM) which may serve as a buffer for image sub-framedata and/or as a frame buffer for other functions. The memory componentsmay additionally include one or more non-volatile memories for long-termstorage of processed images.

User-interface port 837 is coupled to a user display 807 which mayitself include a frame memory (or frame buffer) to store an image to bedisplayed for a user (e.g., a still image frame or video frame). Thoughnot shown, user-interface port 837 may also be coupled to a keypad,touchscreen or other user-input circuitry capable of providinginformation to image processor 803 corresponding to user-input,including operating mode information that may be used to configuredecimation modes within the image sensor 801. Although also not shown,image processor 803 may be coupled to image sensor 801 through asideband channel or other control interface to permit transmission ofoperating mode, configuration information, operation-triggeringinstructions (including image capture instructions,configuration-programming instructions, etc.) and the like to the imagesensor.

FIG. 30 illustrates an exemplary sequence of operations that may beexecuted within the imaging system of FIG. 29 in connection with animage processing operation. Starting at 851, the application processorconfigures ISP 831 for DMA (direct-memory-access) operation with respectto memory control interface 835 and thus memory IC 805. By thisarrangement, the ISP is enabled to operate as DMA controller betweenimage sensor 801 and memory IC 805, receiving subframe data from imagesensor 801 row by row (as shown at 853) and transferring the subframedata to the memory IC. Thus, the subframe data generated by temporaloversampling within image sensor 801 are, in effect, piped through theISP directly to memory IC (e.g., a DRAM) where they may be accessed bythe application processor. Note that, in the embodiment shown, subframesare loaded into the memory one after another until a final subframe hasbeen received and stored (i.e., the frame-by-frame storage loop and itseventual termination being reflected in decision block 855). Thisprocess may be optimized in an alternative embodiment by omittingstorage of the final subframe in memory IC 805 and instead deliveringthe final subframe data directly to application processor 833. That is,as shown at 857, the application processor retrieves and combines (e.g.,sums) the stored subframes to produce a consolidated (integrated) imageframe so that, instead of storing the final subframe in memory and thenreading it right back out, the final subframe may be delivered directlyto the application processor to serve as a starting point for subframedata consolidation. In any case, at 859 the application processorconfigures ISP 831 for operation in image-processing mode and, at 861,outputs the image frame data (i.e., the consolidation of the temporallyoversampled image sensor data) to the image-sensor interface of the ISP(i.e., to the front-end of the ISP via channel 838), thereby emulatingimage sensor delivery of a full image frame to ISP 831. At 863, the ISPprocesses the image frame delivered by the application processor toproduce a finalized image frame, writing the completed (processed) imageframe, for example, to DRAM or non-volatile memory (i.e., one or both ofmemory ICs 805), and/or directly to the frame buffer within display 807to enable the image to be displayed to the system user.

Split-Gate Architecture

FIG. 31 contrasts embodiments of the conditional-reset pixel 250 of FIG.10 and a modified pixel architecture 870, referred to herein as“split-gate” conditional-reset pixel or split-gate pixel. In theembodiment shown, split-gate pixel 870 includes a photodiode 260together with the same floating diffusion 262, reset transistor 259,source-follower 255, and read-select transistor 257 as pixel 250, butomits transfer-enable transistor 253 and single-control transfer-gate251 in favor of a split, dual-control transfer-gate 871. Referring todetail view 880, dual-control transfer gate (or “dual-gate”) includesdistinct (separate) row and column transfer gate elements 881 and 883disposed adjacent one another over the substrate region betweenphotodetector 260 (PD) and floating diffusion 262 (FD). The row andcolumn transfer gate elements (881 and 883) are coupled to row andcolumn control lines, respectively, to receive row and column controlsignals, TGr and TGc and thus are independently (separately) controlled.As discussed in further detail below, by omitting the source/drainimplant ordinarily required between series-coupled transistors (and thusbetween adjacent gate terminals), the row and column transfer gateelements may be disposed closely enough to one another that theresulting overlapping electrostatic fields will form a continuousenhancement channel 885 when both TGr and TGc are asserted, (at a signallevel to provide charge transfer), while maintaining an ability tointerrupt the channel when either of TGr and TGc are deasserted, (at asignal level to prevent charge transfer). Accordingly, the logic-ANDfunction effected by the combined operation of transfer-gate 251 andtransfer-enable transistor 253 in pixel 250 may be achieved within thesubstantially more compact dual-control gate 871, reducing the pixelfootprint (i.e., die area consumption) by a transistor or a significantportion of a transistor relative to pixel 250. In the case of a quadpixel layout, for example, the dual-gate arrangement lowers theper-pixel transistor count from 2.75 T (i.e., when pixel 250 isemployed) to approximately 1.75 T to 2 T, depending on the dual-gateimplementation. In addition to the reduced pixel footprint, thedual-gate design permits a negative potential to be applied to thetransfer gate or transfer gates during the charge-integration (lightaccumulation) interval to reduce PD to FD leakage current and transfergate dark current, a function not readily available in embodiment 250 asa negative TGr voltage may disruptively forward-bias the source/drain tosubstrate diodes in transfer-enable transistor 253. Further, in contrastto the floating potential that results at transfer gate 251 of pixel 250whenever TGc is lowered, row and column transfer gate elements 881 and883 are continuously coupled to signal driving sources and thuscontinuously driven to the driver output voltage (i.e., not floating),potentially reducing noise in the pixel read-out operation.

FIG. 32 is a timing diagram illustrating an exemplary pixel cycle(reset/charge integration/read-out) within the split-gate pixel of FIG.31. As in embodiments described above, the pixel cycle is split intofive intervals or phases corresponding to distinct operations carriedout to yield an eventual progressive read-out in the final two phases(the pixel can also provide an unconditional readout sequence that skipsphase four). Referring to both FIG. 32 and split-gate pixel 870 in FIG.31, a reset operation is executed within the photodiode and floatingdiffusion in phase one by concurrently raising the TGr and TGc signalsto establish a conduction channel between photodiode 260 and floatingdiffusion 262 (i.e., as shown at 885 in FIG. 31), and thereby reset thephotodiode by enabling residual or accumulated charge within thephotodiode to be transferred to the floating diffusion. After (orconcurrently with) the charge transfer operation, the reset-gate signal(RG) is pulsed to switch on reset transistor 259 and thus evacuate/emptycharge from the floating diffusion by switchably coupling the floatingdiffusion to V_(dd) or other supply voltage rail. In the embodimentshown, TGr is driven to a negative potential following the photodetectorreset operation (e.g., immediately after concurrent assertion with TGcor at the conclusion of the reset phase), thereby establishing alow-leakage isolation between the photodetector and floating diffusion,and reducing dark current from the region below TGr. Also, because therow and column control signals are jointly applied to adjacent transfergate elements, TGc may be raised and lowered as necessary following thephotodetector reset operation and during the ensuing integration phase(phase 2) without undesirably floating the transfer gate. Thus, TGc islowered following pixel reset and, while shown as remaining lowthroughout the ensuing integration and noise sampling phases (phases 2and 3), will toggle between high and low states during those phases tosupport reset and read-out operations in other pixel rows.

The noise or reset sampling operation within phase 3, overthresholddetection within phase 4 and conditional read-out (or conditionaltransfer) within phase 5 are carried out generally as discussed inreference to FIG. 11, except that TGc need only be raised in conjunctionwith the TGr pulses (i.e., to VTGpartial and VTGfull) during thepartial-transfer and conditional-transfer operations. In the embodimentshown, a quad-potential TGr driver is provided within the rowdecoder/driver (e.g., within element 305 of FIG. 14) to maintain TGr atthe negative potential throughout the integration phase, and then stepTGr up to a pre-read potential (zero volts in the example shown) at thestart of the noise sampling phase before raising TGr further toVTG_(partial) and finally to VTG_(full) in the overthreshold detectionand conditional read-out operations, respectively. In alternativeembodiments, a three-potential driver may be used to maintain TGr at thenegative potential except when pulsed to VTG_(partial) or VTG_(full)(i.e., no pre-read potential).

FIG. 33 illustrates exemplary low-light and high-light operation of thesplit-gate pixel of FIG. 31, showing electrostatic potential diagrams ineach case beneath schematic cross-section diagrams of the photodetector(photodiode 260 in this example), row and column transfer gate elements881 and 883 (i.e., forming a dual-control transfer gate) and floatingdiffusion 262. As in preceding examples, the depicted levels ofelectrostatic potential are not intended to be an accuraterepresentation of the levels produced in an actual or simulated device,but rather a general (or conceptual) representation to illustrate theoperation of the pixel read-out phases. Starting with the low-lightexample, a relatively low level of charge is accumulated within thephotodiode during the integration phase (phase 2) so that, when TGc isasserted and TGr is raised to the partial-on potential (VTG_(partial))during overthreshold detection phase 4 (i.e., after noise sampleacquisition in phase 3), the charge level is insufficient to betransferred via the relatively shallow channel formed between photodiode260 and floating diffusion 262. Because the accumulated charge leveldoes not exceed the spillover threshold established by application ofVTG_(partial) to the gate element couple to the TGr line, there is nospillover from the photodiode to the floating diffusion and theaccumulated charge instead remains undisturbed within the photodiode.Because no spillover is detected during the overthreshold phase, TGc isdeasserted during conditional transfer (conditional read-out) phase 5.Although some charge will migrate to the well under the row gate duringTGr assertion, that charge will move back to the photodiode well whenTGr is deasserted, thus maintaining the charge level within thephotodiode as a starting point for further charge accumulation in asubsequent integration interval. By contrast, in the high-light example,the higher level of accumulated charge does exceed the spilloverthreshold during overthreshold detection phase 4 so that a portion ofthe accumulated charge (i.e., that subset of charge carriers that areabove the transfer gate partially-on electrostatic potential) spillsover into floating diffusion node 262, with the residual accumulatedcharge remaining within the photodiode as shown at 918. Accordingly,during overthreshold phase 5, TGr is raised to the VTG_(full) potentialconcurrently with assertion of TGc, thus establishing a full conductionpath through the channel formed by the dual-gate structure to transferthe entirety of the accumulated charge from photodiode 260 to floatingdiffusion 262.

FIG. 34 illustrates an alternative overthreshold detection operationwithin the split-gate pixel of FIG. 31. As shown, instead of driving theTGr line to a partial potential (i.e., VTG_(partial)), a fractional(i.e., reduced-width) TGr pulse 920 is applied in conjunction with theTGc pulse (which may also have a fractional pulse width) thus limitingthe time available for charge transfer between the photodetector andfloating diffusion. In one embodiment, for example, fractional pulse 920is a short-duration pulse having a time constant shorter than requiredto transfer all charge above the threshold defined by the voltageapplied to the dual-control transfer gate and therefore transfers thecharge only partially, in contrast to a full-width pulse which is longenough to transfer all of that charge. Accordingly, due to the timeconstant and sub-threshold characteristics of thephotodetector-to-diffusion charge transfer, below-threshold chargeintegration within the photodetector will yield little or no chargetransfer during the fractional pulse interval, while overthresholdcharge integration will yield a detectable charge transfer, analogous,in effect, to application of VTG_(partial) for the full pulse interval.Pulse width control may provide superior performance (i.e., relative tovoltage-level control) in terms of repeatability and/or thresholdprecision, particularly in noisy environments (e.g., where switchingnoise may couple to the TGr line) or where programmable thresholdtrimming or calibration may be needed. As shown at 921, thepartial-readout control, whether pulse-width or voltage-levelcontrolled, alternatively (or additionally) may be applied to the TGcline, particularly where the TGc signal is used to control the gateelement nearest the photodetector. Also, pulse-width control and voltagecontrol may be combined, for example, by driving a fractional pulsehaving a reduced voltage onto the TGc or TGr line. Further, the fullpulse applied to the TGr and/or TGc line during a conditional read-outoperation (and/or during a reset operation) may be replaced by a burstof fractional pulses as shown at 922, thus establishing a uniform(fractional) with for each pulse applied. In one embodiment, the fullpulse width during conditional-readout phase 5 is on the order of 200 to1000 nanoseconds (nS), while the fractional pulse width is on the orderof 2 to 200 nanoseconds, though other fractional and/or full pulsewidths may apply in alternative embodiments. Although shown as operativefor a split-gate embodiment, similar fractional pulse methods are alsoapplicable to the operation of, for example, a FIG. 14 or FIG. 16embodiment.

FIG. 35 illustrates an exemplary implementation of the dual-control gate871 shown in FIG. 31. In the implementation shown, two distinctpolysilicon features 925 and 927 are formed in immediate proximity toone another over the substrate region between photodiode 260 andfloating diffusion 262 with a separation distance (“d_(sep)”) shorterthan the minimum inter-poly distance specified for polysilicon lines ofdrain-to-source-coupled transistors, but long enough to ensureelectrical isolation between the two polysilicon features (i.e.,sufficient separation to avoid shorting the features to one another). Inone fabrication technique, the two polysilicon features are formedseparately to enable a distance d_(sep) that is less than the minimumlithographic feature size. In an alternative embodiment, a singlepolysilicon feature is formed and then etched or otherwise split/dividedinto two distinct polysilicon features (e.g., with d_(sep) set to theminimum lithographic feature size or smaller). In the implementationshown, sidewall spacers 929, 931 are formed with respect to eachpolysilicon line, with spacer structures formed within separation regionmerging as shown at 933 (i.e., due to the narrow d_(sep) dimension) sothat subsequent doping to form source/drain implant structures isblocked within the separation region, thus avoiding formation of such acarrier trapping structure in the otherwise continuous substrate regionbetween photodiode 260 and floating diffusion 262, yielding thedual-gate control described above. While polysilicon feature 925 (Poly1) is shown as the gate element coupled to TGr and polysilicon feature927 (Poly 1′) as the gate element coupled to TGc, that interconnectionarrangement may be reversed in alternative embodiments.

FIG. 36 illustrates an alternative manner of implementing thedual-control gate structure 871 of FIG. 31. In this embodiment, a firstpolysilicon feature 941 is formed (e.g., lithographically printed andetched), covered with a layer of insulating material 945, and then asecond polysilicon feature 943 is formed over the top of the first. Aportion of the second polysilicon feature (not shown) is etched away toexpose and enable metal-layer contact to the initial polysilicon feature941 without removing the (insulating) material 945 that remains in theseparation region (i.e., the region marked by “d_(sep)”). By thisoperation, d_(sep) may be made arbitrarily small (i.e., as small aspossible while maintaining integrity of the insulating material withinthe separation region and thus electrical isolation between the twopolysilicon features) and the overall footprint of the dual-control gateis similar to a single-control gate. Various alternative and/orsupplemental fabrication techniques may be employed in other embodimentsto form the dual-gate structure between photodiode 260 and floatingdiffusion 262.

FIG. 37 illustrates a quad-pixel, shared floating diffusion image sensorarchitecture in which pairs of row and column transfer-gate controllines (TGr1/TGr2 and TGc 1/TGc2) are coupled to a dual-gate structure(957.1-957.4) within each of four split-gate pixels in the mannerdescribed above. More specifically, by centralizing a shared floatingdiffusion 955 between four pixels (each also including a respective oneof photodiodes PD1-PD4 and one of dual-control transfer gates957.1-957.4, together with shared reset-gate transistor 409, sourcefollower 405 and read-select transistor 407) and splitting the columntransfer-gate control line TGc into separate odd and even column-enablelines (TGc1 and TGc2, each coupled to a respective column-line driver),a highly compact pixel layout may be achieved. FIGS. 38 and 39illustrate exemplary physical layouts of the quad-pixel of FIG. 37,showing the four photodiodes disposed about and switchably coupled to acentralized floating diffusion (“FD”) via respective dual-control gatestructures. In the embodiment of FIG. 38, row lines (TGr1, TGr2) arecoupled to respective gate elements 961 nearest the photodiodes andcolumn lines are coupled to gate elements 962 nearest the floatingdiffusion (i.e., gate elements 961 and 962 collectively forming adual-gate), while that interconnect order is reversed in the embodimentof FIG. 39, with row lines coupled to gate elements 972 nearest thefloating diffusion and column lines coupled to gate elements 971 nearestthe photodiodes. In both layouts, each row line may be coupled to thegate elements for photodiodes in the same row (e.g., PD1/PD3 or PD2/PD4in the example shown) via a single metal-to-poly contact and each columnline may likewise be coupled to the gate elements for photodiodes in thesame column (e.g., PD1/PD2 or PD3/PD4) via a single contact, thushalving the contact area as compared to implementations that require twointerconnects per signal line per quad pixel. Also, in the embodimentsof both FIGS. 38 and 39, the shared reset gate transistor, read-selecttransistor and source follower transistor are disposed at the peripheryof the photodiode cell as shown at 964, 965 and 966 in FIGS. 38 and 974,975 and 976 in FIG. 39 (each transistor being shown as a polysiliconline over a diffusion region, omitting interconnect lines to avoidobscuring other features of the drawing). In both layouts, thetransistors may be disposed in positions/locations other than thoseshown. For example, all three shared transistors may be co-located atthe same edge of a given pixel, or all or one or more of the transistorsmay be disposed in a central region of the quad pixel between rows orcolumns of the photodiodes. Also, while a consolidated diffusion regionis shown, the diffusion region may alternatively be split into two ormore interconnected diffusion regions. The structures shown allow bothindividual and selective charge-binned readout of pixels with the quadgroup.

FIGS. 40 and 41 illustrate a split-gate pixel architecture andcorresponding timing diagram according to an alternative embodiment thatlacks a dedicated row transfer-gate (TGr) line. More specifically, theread-select and row transfer-gate control functions are merged within asingle read-select (or row-select) signal coupled to row gate element881 and to read-select transistor 257 as shown, thus reducing the numberof row signal lines per pixel row from three to two (column transfergate element 883 and the remaining shared transistors (255, 259) areconnected as described above). This row line reduction may beparticularly beneficial in front-side illuminated implementations as the33% row metal reduction increases the overall fill factor of the pixelarray. Even in backside illuminated embodiments, the row line reductionmay simplify per-cell signal line interconnection, possibly reducing thenumber of metal layers required or otherwise reducing fabricationcomplexity and cost. Note that frontside or backside illumination may beemployed with respect to any of the embodiments disclosed herein.

Referring to FIG. 41, reset, integration, noise-sampling, overthresholddetection and conditional read-out operations are carried out generallyas described in reference to FIG. 32, except that row transfer gateelement 981 is switched to conducting and non-conducting states throughassertion and deassertion of the read-select signal (RS), andoverthreshold and conditional read-out operations are managed byasserting partial potential (and/or pulse width) and full potential(and/or full pulse sequence) on the column control line (TGc). Thus, aphotodiode reset is effected by asserting TGc concurrently withread-select signal assertion, overthreshold detection is carried out byraising TGc to the VTG_(partial) potential (and/or applying areduced-width TGc pulse) concurrently with read-select signal assertion,and conditional read-out is executed by conditionally (selectively)raising TGc to the VTG_(full) potential as shown. In the embodiment ofFIG. 40, row gate element 981 is disposed nearest the floating diffusionand the column gate element 983 is disposed nearest the photodiode. Thisdisposition may be reversed in alternative embodiments.

FIG. 42A illustrates an alternative dual-control gate arrangement inwhich the gate elements of a dual-control gate are formed by respectivep-doped and n-doped regions of a transfer gate diode 987. The doping isachieved by depositing a lightly or intrinsically doped polysilicon, andusing the pinning implants and FD implants to dope the PD and FD sidesof the TG respectively. Alternate methods can also be employed. Withthis structure the TGr signal is connected to the p-type side of thediode 987 via a first contact (not shown), and the TGc signal isconnected to the n-type side of the diode 987 via a separate, secondcontact (also not shown). Electrical isolation of the two gate controlsignals is achieved by diode isolation and does not require twophysically separate polysilicon structures. As a result the dual-controlgate is smaller.

FIG. 42B illustrates another alternative dual-control gate arrangementin which the gate elements of a dual-control transfer gate 990 areformed by respective p-doped regions of back-to-back diodes having ashared n-doped region 991. The doping is achieved by depositing alightly or intrinsically doped polysilicon, and using the pinningimplants, FD implants and/or specific transfer gate doping implants todope the PD and FD sides and center n-type region (991) of thedual-control transfer gate, respectively. As with all embodimentsdisclosed herein, alternative fabrication methods can be employed. Withthis structure the TGr signal is connected to the p-type side of thediode adjacent to the PD via a separate contact, (not shown), and theTGc signal is connected to the p-type side of the diode 990 adjacent tothe FD via a separate contact, (not shown). Electrical isolation of thetwo gate control signals is achieved by diode isolation (interveningn-type region 991) and does not require two physically separatepolysilicon structures.

FIG. 43 illustrates a 4×1 block of split-pixels (a quad, split-pixelblock) that may be operated in binned or independent-pixel modes asdescribed above, for example, in reference to FIG. 21. As shown,floating diffusion regions FD₁₂ and FD₃₄ for upper and lower pixelpairs, respectively, are interconnected via conductor 992 (oralternatively formed by a single floating diffusion region), thuspermitting, for example, the states of photodiodes PD1 and PD3 orphotodiodes PD2 and PD4 to be read conjunctively (i.e., readconcurrently or as one). Each photodiode in the 4×1 pixel block isswitchably coupled to a floating diffusion node via a dual-control gate,with a row gate element 993 coupled to a respective one of the four rowlines (i.e., TGr1-TGr4 for photodiodes PD1-PD4, respectively) and acolumn gate element 994 coupled to the per block column line. In theimplementation shown, a shared column-line contact is coupled to each ofthe two column gate elements adjacent a given floating diffusion, thushalving the required number of column line interconnects. Sharedtransistors 995, 996 and 997 (i.e., reset-gate, source follower andread-select transistors) are disposed in regions between photodiodesPD1-PD4, though any or all of those transistors may be disposed at otherpositions. Also, while the row line is coupled to the dual-control gateelement nearest the photodiode and column line coupled to the gateelement nearest the floating diffusion, that arrangement may be reversedin alternative implementations.

Bandwidth Reduction—Threshold-Referenced Visually Lossless Lookup Table

FIG. 44 illustrates an imaging system architecture in which the datatransfer bandwidth required between an image sensor 1001 and imageprocessor 1003 is reduced through one or more data compressionstrategies. In the embodiment shown, for example, image sensor 1001employs a visually lossless lookup table (VLL) 1025 to reduce the volumeof data required to convey the oversampled output of aconditional-reset/readout pixel array to image processor 1003, and imageprocessor 1003 includes circuitry and/or logic (e.g., within an imagesignal processor 1031, application processor 1033 or both) to execute aninverse-VLL operation 1032 to reproduce the pre-VLL output of pixelarray 1011 as closely as possible. As in embodiments described above,image sensor 1001 includes row and column logic (1015, 1017) to conductrow-by-row pixel read-out operations, line memory (1019) to store theread-out results for eventual transfer, a physical interface toeffectuate image data transfer (PHY 1021) over output path 1022 to acounterpart PHY 1027 within image processor 1003, and control logic(1020) to provide timing and control signals to the other circuit blocksas necessary to synchronize and pipeline their operations. In additionto image-data-transmitting output driver circuitry, PHY 1021 includesreceive circuitry to receive commands and data from the image processorvia signaling path 1024 (which may be a bidirectional path also used toconvey image data and/or status), including lookup table data to beloaded into the VLL 1025 as discussed below. Though not specificallyshown, the imaging system of FIG. 44 additionally includes one or morememory components that interface with image processor via memory controlcircuitry 1035, and one or more user-interface components (e.g., adisplay on which images may be rendered) coupled to UI port 1037.

FIG. 45 illustrates an exemplary compression function that may beapplied within the VLL of FIG. 44 to convert an N-bit input(VLL_(IN)[N−1:0]) to an M-bit output (VLL_(OUT)[M−1:0]), where M<N. In anumber of embodiments, the compression function corresponds generally toa log function (shown by the curve at 1041), but with a linearizedinitial region 1042 to enhance resolution relative to the steepest partof the log curve and thereby minimize the loss caused by the VLL. In oneimplementation, for example, VLL_(IN)=VLL_(OUT) up to the maximum inputvalue (X) of the linear region.

Continuing with FIG. 45 and considering that no read-out occurs inpixels yielding below-threshold partial-transfer samples (i.e., thosepixels instead being permitted to continue charge integration into asubsequent subframe), it follows that the portion of the VLLtransformation that corresponds to input values below the threshold neednot be converted for subframes that employ conditional readout. Thus,instead of mapping the VLL compression curve to the entire range ofpossible input values, the compression curve may be encoded with thepixel reset threshold (or slightly above or below the threshold) as thestarting point, thereby reducing the input range by Y, the valuecorresponding to the pixel reset threshold in the full-range mapping. Anexample of such a “threshold-referenced” VLL transform is shown in FIG.46, in this case representing any pixel yielding a partial-transfersample at or below the reset threshold with a zero-valued VLL output andshowing the input values for which no output representation is needed(or provided) as a dashed line extending below the pixel resetthreshold.

Reflecting on the threshold-referenced VLL shown in FIG. 46, because therange of possible input values is reduced by Y (i.e., the input values 0to Y−1 need not be mapped to output values), it becomes possible to (i)reduce the corresponding output range (and possibly the number of bitsrequired to convey the range of output values) while maintaining thesame VLL resolution, (ii) increase the VLL resolution by mapping thesame number of output values (e.g., 2^(M)) to the reduced number ofinput values, or (iii) both reduce the output range and increase theresolution in the case of a sufficiently high conditional read/resetthreshold. Further, in an oversampling image sensor embodiment thatpermits the conditional read/reset threshold to be varied or adjustedfrom subframe to subframe (i.e., threshold for at least one subframe ofa multi-subframe exposure interval is different from the threshold forat least one other subframe), correspondingly varied VLLs may beapplied, including, in some cases, VLLs having different output bitdepths. For example, a subframe-specific conditional read/resetthreshold that reduces the required output range by half enables outputbit-depth to be reduced from M bits to M−1 bits, thereby furtherreducing bandwidth requirements in the imaging system.

In addition to threshold-referenced VLLs (e.g., applied to respectivesubframes of an overall frame interval), VLLs may output reserved codesto signal underthreshold conditions and saturation conditions, thelatter including extreme brightness conditions that cause the resetstate of the floating diffusion to collapse—the above-mentioned“eclipse” events in which the resulting read-out mimics a low-light(dark) condition. More specifically, the zero-valued output (or anyother output) of a given VLL may be reserved to represent anunderthreshold condition and thus an unknown state of the pixel for thesubframe at issue, while an all ‘1’ VLL output (i.e., ‘FF’ inhexadecimal format in the case of an 8-bit VLL output, but any otheroutput could be so defined) may signify a saturated or eclipsed pixeland thus another unknown pixel state. The inverse VLL logic implementedwithin the image processor (element 1032 of FIG. 44) may detect suchout-of-range codes and take appropriate processing steps to compensatefor the missing pixel values.

Referring again to FIG. 44, in addition to the bandwidth reductioneffected by VLL logic 1025, column logic 1017 may selectively disablesample digitization (i.e., disabling analog-to-digital-converter (ADC)operation) when underthreshold, saturation or eclipse events aredetected, thereby reducing power consumption. Also, the disableddigitization may be signaled to downstream logic, including the VLL andline memory PHY, to disable operations in any or all of those circuitblocks, thus avoiding power and bandwidth consumption with respect tosuch non-readouts. In a number of embodiments described below, theresult of the pixel state assessment (i.e., determining whether thepixel is underthreshold, eclipsed and/or saturated (with the eclipsestate in some embodiments treated as a special case of saturation)) iscaptured by read-enable circuitry within the image sensor column logicand output as a set of one or more flag bits. Examples of such flag bitsinclude the underthreshold and eclipse bits described above in referenceto FIG. 24. Further in a number of embodiments, the information conveyedin the underthreshold and eclipse bits are logically reorganized in aread-enable bit (RE) and an above/below range bit (AB), where the RE bitis set (e.g., to a logic ‘1’) if the subject pixel is not eclipsed andnot saturated and not underthreshold, and cleared (or reset) otherwise.If the RE bit is cleared (i.e., RE=0 to indicate that the pixel iseither underthreshold, eclipsed or saturated), then the AB bit is set toindicate a saturation condition (i.e., eclipsed or above saturationthreshold) and cleared to indicate an underthreshold condition. Asexplained below, because the AB bit is unneeded when the RE bit is setand the ADC output is unneeded when the RE bit is cleared, a single bitwithin the line memory may be used to store either the AB bit or a bitof the ADC output, depending on the state of the RE bit, thus reducingthe amount of line memory storage required to capture row read-outresults.

FIG. 47 illustrates embodiments of a line memory 1050 and VLL logiccircuit 1053 that may be used to implement the line memory and VLL logicshown in FIG. 44, together with output drivers 1059 that may be includedwithin the image sensor PHY. In the embodiment shown, each output driver1059 is assumed to drive a bit-serial differential link (a single-endedlink may alternatively be used) that corresponds to an output “lane” ofthe image sensor, with each output lane including a respective VLL logiccomponent 1057 and a respective segment of line memory 1050. Further,for purposes of example only, individual ADC/Flag values output fromline memory 1050 to the VLL logic 1053 are assumed to include aneleven-bit composite value constituted by a 10-bit ADC value (ADC[9:0])and a single-bit read-enable flag (RE), with the most significant bit ofthe ADC value, ADC[9], doubling as the AB bit when RE is low. FIG. 48depicts an exemplary output table corresponding to such an arrangementand showing the interpretation of the ADC field (i.e., within the linememory) and VLL output for the various states of the RE and AB flagbits. Each VLL logic component 1057, for its part, generates an encodedoutput that indicates either an out-of-range condition (underthresholdor saturated/eclipsed) or a point in the overthreshold portion of acomposite VLL transform as explained above. Also, at least in the FIG.47 embodiment, each VLL logic component 1057 drives a parallel set ofeight signal lines (assuming a 10-bit to 8-bit compression), one or moreof which may remain undriven in low bit-depth compressions and/orinstances of out-of-range pixel states. These specific numbers of bitsand flag encoding schemes are carried forward in a number of embodimentsdescribed below, but in all such cases any practicable alternativerepresentation of flag/status bits and/or quantities of bits conveyed inADC values or composite flag-ADC values may apply.

Still referring to the embodiment of FIG. 47, line memory 1050 includestwo component memory buffers, referred to herein as the primary buffer1051 and secondary buffer 1052, together with column multiplexercircuitry 1055. Though not specifically shown, primary buffer 1051 iscoupled to receive the parallel outputs of the column logic (e.g.,element 1017 in FIG. 44) and, when fully loaded, transfers the read-outresults in parallel to the secondary buffer 1052, thereby freeing theprimary buffer to be loaded with read-out results from a subsequent rowof the pixel array while data from the secondary buffer is streamed,column by column (and lane-parallel), to the VLL logic components 1057and serializing output drivers 1059. Multiplexing circuitry 1055 isprovided to serialize the output of the secondary buffer segmentallocated to each output lane (i.e., selecting image data from one pixelcolumn at a time) in the embodiment shown, but may be omitted inembodiments in which the secondary buffer is organized as a set ofparallel-load, shift registers that shift out one column data value at atime. Also, while each column data value is depicted as an 11-bit valueconsisting of an RE bit and 10-bit ADC value (with the most significantbit of the ADC value serving as an AB bit when RE is low), otherflag-bit formats and ADC bit depths (e.g., 12-bit ADC instead of 10-bit)may be employed in alternative embodiments or configurations. Lastly,while the VLL logic component 1057 for each lane is shown to output an8-bit output (e.g., with the all ‘1’ and all ‘0’ values encoding thesaturation/eclipse and underthreshold conditions, respectively),alternative output bit depths may apply (e.g., 10-bit in the case of a12-bit ADC value) and/or the flag bits (RE bit, AB bit or other flagencodings) may be explicitly output from the image sensor instead ofbeing encoded within the VLL output value.

FIG. 49 illustrates an exemplary sequence of four subframes thatconstitute an image frame interval (exposure interval) within the imagesensor of FIG. 44. There may be more or fewer subframes per image framein alternative implementations or configurations. As in embodimentsdescribed above, image pixels are conditionally reset and read outduring all but the last subframe, with all pixels being unconditionallyread and reset during that final subframe. Further, in the embodimentshown, different pixel reset thresholds are applied in each of theconditional read/reset subframes (any of which may have a differentduration than any other of the subframes), and correspondingly differentthreshold-referenced VLLs are applied to compress the readout.

FIG. 50 illustrates an exemplary per-lane VLL logic component 1065capable of applying subframe-specific threshold-referenced VLLs as shownin FIG. 49, and that may be employed to realize the individual per-laneVLL logic circuits 1057 depicted in FIG. 47. As shown, VLL logic circuit1065 receives a read-enable bit (RE), a 10-bit ADC value (the MSB ofwhich serves as the AB bit when RE is low), and a subframe-advancesignal (SFA) that signals transitions between subframes. Thesubframe-advance signal is applied to a subframe counter 1069 (“SF CNT”)which, in this four-subframe per complete frame example, progressesthrough a modulo-four subframe count sequence (0, 1, 2, 3, 0, 1, 2, 3 .. . or, in binary notation: 00, 01, 10, 11, 00, 01, 10, 11 . . . ) asthe subframe-advance signal cycles (which may be four times per frame orup to once per row, for fully interleaved readout). A 2:4 decoder 1071converts the counter output into a one-hot set of four VLL selectsignals which are in turn applied, along with the read-enable bit, torespective logic gates 1073 ₀-1073 ₃ to gate a delayed version of thesubframe-advance signal (i.e., delayed by element(s) 1059). By thisarrangement, when the RE bit corresponding to a given ADC value is high(indicating a valid ADC value), a subframe-count-indexed one of the fourgates 1073 ₀-1073 ₃ is enabled to pass the delayed sub-frame advancesignal to the enable input of a respective one of VLLs 1075 ₀-1075 ₃,thus enabling one of the four VLLs (collectively, VLLs 1075) to output alookup value corresponding to the incoming ADC value. In the embodimentshown, the outputs of VLLs 1075 are supplied to multiplexer 1079 andoutput therefrom when RE=1. When RE is low, the AB bit (i.e., mostsignificant bit of the ADC value in this example) selects either an all‘0’ or all ‘1’ value to be output to downstream logic, thereby signalingan underthreshold condition or a saturated/eclipsed condition, as thecase may be. More compact output forms may be chosen to represent theout-of-range conditions (under threshold or saturated/eclipsed) inalternative embodiments, as discussed below.

Still referring to FIG. 50, a serializer 1081 converts the multi-bitoutput of multiplexer 1079 into a serial bit stream, in this caseperforming an 8:1 parallel-to-serial conversion. The serializer outputmay be compressed further by compression logic 1083 (e.g., which mayimplement Huffman coding or any other practicable compressed-outputencoding) to reduce the volume of output data. To accommodatenon-uniform bit-depth VLL implementations (e.g., some VLL outputs beingrepresented in fewer bits than outputs of other VLLs), one or more bitdepth signals may be supplied to serializer 1081 to specify the numberof valid bits conveyed in the multiplexer output. In one embodiment, forexample, the bit depth signal is a single-bit signal that is high toindicate a full bit-depth (i.e., all output lines from multiplexer 1079output carry valid image data) and low to indicate a lesser bit-depth(e.g., one or more lines of the multiplexer output are unused). In otherembodiments, the bit depth signal may be a multi-bit signal to indicatemore than two possible bit depths, and in yet other embodiments, theoutput of the VLLs and/or multiplexer 1079 are used, alone or togetherwith an explicit bit-depth signal, to indicate bit depth (e.g., MSB orMSBs of VLL output or multiplexer output indicates bit depth). In anycase, serializer 1081 operates to pack the outgoing serial bit stream inaccordance with the bit-depth indication. FIG. 51, for example, depictsthe serializer output as a sequence of samples, with eight-bit samples(s_(i), s_(i+1), s_(i+2), . . . ) being transmitted back-to-back (i.e.,without any unused transmission slots) in an 8-bit bit-depth mode, and7-bit samples being transmitted back-to-back in a 7-bit bit-depth modeto effect a compression ratio of 7:8 (12.5% data reduction).

Referring to detail view 1088 in FIG. 50, the functions of serializer1081 and VLL output multiplexer 1079 may alternatively be implementedwithin a serializer circuit 1091 that receives the VLL outputs, flagbits (RE, AB/ADC[9]), and bit depth signals and includes gear logic tooutput digitized samples having one of multiple depths according tothose inputs, including a two-bit value in cases where RE is low, and aneight-bit value when RE is high. As an example, the RE bit may form themost significant bit of each packet, with the remaining number of bitsbeing one (AB bit) or seven (seven-bit VLL output) according to whetherthe RE bit is low or high, respectively. Other bit-depths may apply inalternative embodiments or configurations.

Low Power, Pipelined Image Sensor

FIG. 52 illustrates an embodiment of a low power image sensor that maybe used to implement component circuitry within the image sensor of FIG.44. In the example shown, image sensor 1101 includes a pixel array 1011,multi-bank sample-and-hold (S/H) circuitry 1103, column-sharedprogrammable-gain (PG) amplifier bank 1105 (PGA), comparator/ADCcircuitry 1107 (including per-column comparator circuitry andcolumn-shared ADC circuitry as discussed below), and line memory 1050.Pixel array output lines convey pixel read-out signals tosample-and-hold circuitry 1103, which in turn supplies analog samples ofthe read-out signals, with and without gain from the PGA 1105, tocomparator/ADC circuitry 1107. To conserve die area, a singleprogrammable gain amplifier 1105 and single ADC circuit 1130 are sharedamong K columns of the pixel array and cycled K times for each row ofthe pixel array. By contrast, a dedicated (separate) thresholdcomparator 1122 is provided for each column of pixels to enable pixelstate (e.g., eclipse, under/over threshold, saturation) to be assessedacross an entire row of pixels in parallel. In the embodiment shown,such “per-column” threshold comparators 1122 are operated cyclically toperform multiple pixel state evaluations per pixel row (i.e., inparallel for each pixel in the row), including an eclipse assessment todetermine, for each pixel in the row, whether the reset state of thefloating diffusion has fallen below an eclipse threshold; anunderthreshold assessment to determine whether charge integration withinthe pixel has exceeded a conditional read/reset threshold, and asaturation assessment to determine whether the pixel charge integrationlevel sampled in a conditional read/reset operation exceeds a saturationthreshold (i.e., a threshold corresponding to a saturation point of ADCcircuit 1130). Thresholds corresponding to the various pixel stateassessments (e.g., eclipse threshold, conditional read/reset threshold,saturation threshold) are applied one after another to the input of theper-column comparators 1122 via corresponding reference multiplexers1120, and a comparator input multiplexer 1121 is provided to selectbetween multiple sample-and-hold circuit outputs as discussed below.

Comparator results for each pixel column are captured within arespective read-enable logic circuit 1125 which conditionally drives aconditional read/reset signal (e.g., TGc) back to the pixel column andalso outputs read-enable and above/below-range bits (RE and AB) toprimary buffer 1051 of line memory 1050. After pixel state assessment iscomplete for a given pixel row, the read-enable bit for each of Kcolumns is passed, one after another via multiplexer 1126, to the enableinput of column-shared ADC (analog-to-digital converter) circuit 1130and to column-shared PGA 1105, thereby selectively enabling digitizationof individual column read-outs (i.e., according to the logic state ofthe selected RE bit), suppressing signal amplification and digitization(and thus conserving power) for pixels that are eclipsed, below theconditional read/reset threshold, or saturated. Multiplexer 1127 isprovided to demultiplex (i.e., distribute) digitized samples fromcolumn-shared ADC circuit 1130 into respective per-column storagelocations within the primary line-memory buffer 1051 including, in theembodiment shown, overwriting the AB bit location.

Still referring to FIG. 52, pipelined operation within the various dataread-out stages (i.e., pixel state assessment, conditional ADC, and linememory read-out) is enabled, at least in part, by multi-banksample-and-hold circuitry 1103. In the embodiment shown in detail view1104, for example, three separate sample-and-hold banks are provided forsequentially executed read-out operations, including an “Eclipse/Vt”bank 1113 that stores pixel samples evaluated to detect eclipse eventsand determine whether the conditional read/reset threshold is exceeded(the latter referred to alternately as “Vt assessment” or conditionalread/reset threshold assessment); an even-row conditional read S/H bank1115 (Conditional Read Bank 1) to store pixel samples that enablesaturation detection and read-out digitization (ADC operation) foreven-numbered pixel rows, and an odd-row conditional read S/H bank 1117(Conditional Read Bank 2) to store pixel samples that enable saturationdetection and read-out digitization for odd-numbered pixel rows. Asexplained in greater detail below, by providing a separate (dedicated)Eclipse/Vt bank 1113, S/H for the comparator operation can be pipelinedwith storage into the conditional read S/H banks. Thus, by providingseparate conditional read S/H banks for even and odd rows andalternately storing samples therein for eventual digitization within thecolumn-shared ADC circuitry, it becomes possible to pipeline pixel stateassessment and ADC operations from row to row.

Referring to detail view 1132, an exemplary implementation of RE logic1125 includes shift register 1133 to capture the output of comparator1122 following a sequence of per-row pixel assessment evaluations,latching each new assessment result (i.e., comparator output, includingan eclipse flag, overthreshold flag and below-saturation flag) inresponse to a timing signal from the sensor control logic (e.g., element1020 of FIG. 44). Read/reset logic 1135 evaluates the states of theeclipse and overthreshold (i.e., above Vt) flags when enabled by anothertiming signal (or state transition signal), asserting a conditionalread/reset signal according to their states as discussed below.Similarly, Enable-ADC logic 1137 outputs read-enable andabove/below-range bits (RE) and (AB) for the pixel under evaluation inresponse to another control/timing signal and according to the states ofthe eclipse, overthreshold and below-saturation flags.

FIG. 53 illustrates a sequence of operations that may be executed withinthe pixel array, sample/hold banks and comparator circuitry of FIG. 52to carry out pixel state assessment and enable subsequent PGA and ADCoperation for row after row of pixels. In the implementation shown, eachimage frame is assumed to contain a sequence of conditional-readsubframes that conclude with conditional read/reset operations, and afinal unconditional-read subframe in which the integration states ofpixels within the subject row are unconditionally read-out and, if nosaturation or eclipse condition is detected, digitized to yield asubframe output.

Starting at 1141, row and subframe indices (Row, SF) are cleared tozero, followed by a three-phase pixel assessment operation involving, inorder, the selected pixel row (i.e., row zero in the first loopiteration), the sample and hold circuitry, and thecomparator/read-enable logic. More specifically, the floating diffusion(FD) is reset in a pixel operation at 1143, a sample of the FD resetstate is captured in the sample-and-hold circuitry at 1145 and thereset-state sample is compared with an eclipse threshold at 1147, withthe result of the eclipse assessment being latched as a Boolean“Eclipse” flag (e.g., within RE shift register 1133 of FIG. 52). If thesubframe is not the last (final) subframe in the exposure interval(negative determination at 1149), another three-phase pixel assessmentoperation is carried out to determine whether charge integrated withinthe pixel has exceeded the conditional read/reset threshold. Thus, apartial transfer from photodetector to floating diffusion is executed ina pixel operation at 1151, a sample of the signal-state of the floatingdiffusion (enabling determination of whether a least a specified amountof charge was transferred during the partial-transfer operation) iscaptured within the sample and hold circuitry at 1153, and thesignal-state sample is compared within a conditional read/resetthreshold (ThreshR) within the comparator circuitry at 1157, with theresult of the comparison being latched as a Boolean “OverThr” flagwithin the RE logic. In the embodiment shown, if the subframe is thefinal subframe (i.e., affirmative determination at 1149), the partialtransfer operation at 1151 is bypassed, thus leaving the state of thephotodetector undisturbed in preparation for an unconditional readoperation (note that some other operating modes may have more than oneunconditional read per row per frame). In one implementation, the sampleand hold operation at 1153 and the ThreshR comparison/OverThr latchingoperations at 1157 are carried out regardless of whether partialtransfer operation 1151 is bypassed, thus simplifying control of thesample and hold circuitry and comparator/RE logic (i.e., the logic mayoperate the same way for each subframe so that no subframe-dependentcontrol operation is needed with respect to the operations shown at 1153and 1157). In alternative embodiments, the control logic may account forthe final subframe condition and bypass the partial transfer sampleoperation 1153 and/or comparator/read-enable logic operation 1157.

Referring to the read/reset determination at 1159, if either the Eclipseflag or OverThr flag is set (indicating that the subject pixel is in aneclipsed state and thus should be reset, or that sufficient charge hasbeen integrated within the pixel to trigger conditional read and reset),or if the subframe is the final subframe in the integration interval(indicating that an unconditional read/reset is to be performed), then afull transfer from photodetector to floating diffusion is executed inthe pixel operation at 1161 (thus resetting the photodetector), followedby capture of the signal-state of the floating diffusion in asample-and-hold operation at 1163, and then a comparison of thesignal-state sample with a saturation threshold (ThreshS) at 1165, withthe comparison result being latched as a Boolean “BelowSat” flag withinthe RE logic (a differential saturation test may be applied inalternative embodiments, comparing the difference between thesignal-state sample and reset sample with the saturation threshold).Note that the floating diffusion of the pixel will be reset at 1143before further sampling so that the photodetector-to-floating diffusioncharge transfer at 1161 effectively resets the pixel. Thus, if the pixelis eclipsed, has integrated charge above the conditional read/resetlevel, or is being evaluated in the final subframe of an exposureinterval (i.e., affirmative determination at 1159), the pixel is reset.By contrast, if the pixel is neither eclipsed or overthreshold in anon-final subframe (negative determination at 1159), the charge transferoperation at 1161 is bypassed, thereby preserving charge within thephotodetector to enable integration to continue into the next subframe.Note that the sampling operation at 1153 and BelowSatcomparison/result-latch at 1157 may be omitted for eclipsed pixels in analternative embodiment.

At 1167, the OverThresh, BelowSat and Eclipse flags are evaluatedtogether with the final-subframe indication to either enable or disablePGA and ADC operation with respect to the subject pixel, a selectioneffected by setting or clearing the RE bit in a line memory writeoperation at 1169 or 1171, respectively. More specifically, if the pixelstate flags indicate that the pixel is not eclipsed and below thesaturation threshold, and either (i) the subframe is the final subframeor the pixel state flags indicate that the partial read-out exceeded theconditional-reset threshold (i.e., affirmative determination at 1167),then PGA and ADC operation is enabled by setting the read-enable bit ina line memory write operation at 1169. In that case, the value writtento the AB bit, if any, is a don't care ('X′) as the set RE bit willenable a subsequent ADC output to overwrite the AB bit. If the pixelstate flags indicate that the pixel is either eclipsed or saturated, ordoes not exceed the conditional read/reset threshold (except in finalsubframe), or is not below the saturation threshold (i.e., negativedetermination at 1167) then PGA and ADC operation is disabled byclearing the read-enable bit in a line memory write operation at 1171.If ADC operation is disabled, the AB bit is written with a value thatindicates whether the pixel state is saturated or eclipsed (AB:=1), orthe pixel is underthreshold (AB:=0). Note that the expression shown inoperation 1171 reflects the particular implementation of the pixelassessment shown in FIG. 53 (i.e., OverThresh is meaningless if thepixel is eclipsed, and BelowSat is meaningless if Overthresh and Eclipseare both false in a non-final subframe) and may be different for adifferent pixel assessment sequence. Following the line memory writeoperation at 1169 or 1171, the row index is incremented by the scansequencer (i.e., within control logic 1020 of FIG. 44) at 1173 inpreparation for loop iteration with respect to the subsequent pixel row,rolling/resetting to row zero following loop iteration with respect tothe final row in the sensor (for interleaved operation, row sequencingwill not be sequential and the subframe index may change at each row).If a row reset occurs (i.e., affirmative determination at decision1175), the subframe index is incremented at 1177 in preparation forsubsequent subframe processing, rolling to zero if the just-processedsubframe was the final subframe in an exposure. Note that depending onthe pixel architecture and subframe exposure method, the next row maynot be physically adjacent to the subsequent row.

Referring to FIGS. 52 and 53, in one embodiment, the comparator/RE logicoperations shown at 1147, 1157 and 1165, not only latch the comparatoroutput within the RE logic (e.g., shifting the comparator result intoshift register 1133 of FIG. 52), but also advance the control input toreference multiplexer 1120, thereby sequencing in order through theeclipse, conditional-reset and saturation thresholds (ThreshE, ThreshR,ThreshS). While not specifically shown, the conditional reset and/orsaturation thresholds may be changed from subframe to subframe, thusenabling subframe-specific thresholds to be applied according subframeduration (i.e., setting a higher or lower conditional reset thresholdaccording to the subframe integration interval), programmable gainsettings (i.e., aligning ThreshS with the signal level that willsaturate the ADC for a given programmable gain setting), and/or anyother factors.

FIG. 54A illustrates an exemplary timing diagram in accordance with thesensor architecture of FIG. 52 and operational sequence of FIG. 53,including alternate TGc waveforms, “TGc (split-gate)” and “TGc(unit-gate),” corresponding to split-gate and continuous-gate pixelarray embodiments, respectively. As noted above, the TGc waveforms forthe two embodiments differ primarily in the TGc state during intervalsof isolation between photodetector and floating diffusion. In theexemplary diagram of FIG. 54A, for instance, TGc is lowered in thesplit-gate embodiment to maximize the isolation between photodetectorand floating diffusion, but held high in the continuous-gate embodimentfor the same purpose (i.e., to ensure that the low state of the TGr lineis applied to the transfer gate and thus avoid (or minimize) thefloating transfer-gate condition.

FIGS. 54B and 54C present exemplary read-out sequences that may beemployed with respect to even and odd rows of pixels. More specifically,FIG. 54B illustrates a non-shared pixel architecture where even and oddrows and pixels have a dedicated RS control and are read-out one afteranother, while FIG. 54C illustrates a shared pixel architecture in whicheach pair of pixels within a pixel column form a two-pixel cell (sharinga floating diffusion) and share a read-out line. In this arrangement, afirst 2-row by 1-column shared pixel cell containing even-row pixels ‘i’and ‘i+2’ and a second 2-row by 1-column shared pixel cell containingodd-row pixels ‘i+1’ and ‘i+3’ constitute a 4-row by 1-column region. Asingle row-select signal (RS-E) is provided for the first shared pixelcell (the even-row pixels) and another single row-select signal (RS-O)is provided for the second shared pixel cell (the odd-row pixels). Therow readout order is as shown from top down (i.e., i, i+2, i+1, i+3) toavoid resource conflict with the shared floating diffusion region in theshared pixel cells. In general, the timing diagram of FIG. 54A,sample-and-hold circuitry described below in reference to FIG. 55 andsample-and-hold pipeline shown in FIG. 56 refer to the dedicatedrow-select embodiment of FIG. 54B. In all cases, the timing events andcircuitry shown may be extended to cover the shared-read-outarchitecture of FIG. 54C or other shared read-out (shared floatingdiffusion) architectures, including 2×2 pixel-sharing readoutarchitectures where each row readout may only be a half-row (even or oddcolumns) readout. It is also noted that “even” and “odd” readout refersto the use of the sample and hold registers and does not require thatreadout of an odd array row always follow an even array row—forinterleaved readout where a row readout from one subframe is followed bya row readout from another subframe, the two row indices always may bespaced apart in the array and thus an even row could follow another evenrow in readout order, without causing a resource conflict.

In the timing example presented in FIG. 54A, interleaved pixel rowoperations are executed for even and odd pixel rows with the rowoperations for any single row corresponding to those shown in FIG. 53.More specifically, pixel reset, reset-state sample, eclipse assessment,partial transfer, signal-state sample and overthreshold (i.e.,conditional read/reset threshold) assessment operations are executedwith respect to even pixel row ‘i’ during an interval in which aneven-row row-select signal (RS-E) is asserted as shown at 1201, followedby pixel reset, reset-state sample and eclipse assessment operationswith respect to odd pixel row ‘i+1’ during assertion of odd-rowrow-select signal (RS-O) at 1203. Thereafter, RS-E is raised again at1202 to enable signal-state sample capture following a conditionalread/reset operation in pixel i, with RS-O and RS-E thereafter beingalternately enabled to permit interleaved (pipelined) reset-state andsignal-state sampling operations with respect to the even and oddsample-and-hold banks. As discussed above, pixel reset is effected byassertion of a reset-gate signal (RG) as shown at 1205 to couple thefloating diffusions within a given row of pixels to a reset potential.Note that the pixel row index ‘i’ shown beneath the signal pulse in thesignal RG waveform signifies a pulse on the RG signal line for row ‘i’,while pulse ‘i+1’ shown in that same waveform signifies a pulse on theRG signal line for row ‘i+1’ and thus the pulsing of a separate signalline—this indexed interpretation applies in a number of waveformsdepicted in FIGS. 54A and 55.

Continuing with FIG. 54A, a row ‘i’ reset-state sample capture withinthe Eclipse/Vt S/H bank is triggered by assertion of SHR_(comp) at 1207,with SHR_(1a) being simultaneously (1209) asserted to capture areset-state sample within the even row conditional read S/H bank, thelatter sample to be applied during subsequent saturation assessment and,if enabled, ADC operation. An eclipse signal is pulsed at 1211 to enablethe SHR_(comp) reset-state sample to be compared with an eclipsethreshold (ThreshE) and latch the comparison result (e.g., within the RElogic as discussed above). Thereafter, at 1217, TGc is pulsed(split-gate embodiment) or maintained high (continuous-gate embodiment)and TGr is concurrently raised to a partial-transfer potential (e.g.,VTG_(partial) as discussed above) at 1213 to enable partial chargetransfer from photodetector to floating diffusion, followed by anSHS_(comp) pulse at 1223 to capture a signal-state sample of thefloating diffusion within the Eclipse/Vt sample-and-hold bank. In thecase of a non-final subframe, Vtcomp is pulsed at 1225 to compare thepartial-transfer sample (i.e., the signal-state sample less thereset-state sample within the Eclipse/Vt sample-and-hold bank) with theconditional read/reset threshold (ThreshR) and latch the comparisonresult. As discussed above, the Vtcomp pulse may be suppressed in asubframe in view of a forthcoming unconditional read.

Still referring to FIG. 54A, the read-enable logic conditionally assertsthe TGc signal at time 1219 (i.e., if the conditional read/resetthreshold is exceeded, the pixel is eclipsed or an unconditionalread/reset is to be performed), concurrently with the full-transferpulse 1215 on the TGr line, thereby enabling charge integrated withinthe photodetector to be transferred in its entirety to the floatingdiffusion, resetting the photodetector in preparation for the nextintegration interval. SHS₁ is pulsed at 1226 to capture the signal stateof the floating diffusion within conditional read S/H bank 1, and at1227 a saturation signal is pulsed to enable the floating diffusionsignal state less reset-state (the latter captured in response to theSHR_(1a) pulse at 1209, or alternately the floating diffusion signalstate) to be compared with an appropriate saturation threshold(ThreshS). As discussed above, the combined pixel assessment results(i.e., eclipse, conditional read/reset and saturation assessments) maybe recorded in line memory in the form of RE and AB bits, thus enablingcolumn-sequential ADC operations to be carried out selectively accordingto the RE bit state for each individual pixel column. At 1229, a convertsignal is cycled K times (e.g., 48 times) per row read interval (e.g.,2.75 microseconds, though different row intervals may apply) to enablecolumn-shared ADC operation, with the output of each individual pixelcolumn (i.e., signal state less reset state amplified according to thegain selected within the programmable gain amplifier) beingselectively/conditionally digitized according to the state of thecorresponding RE bit. Digitized read-out values are stored within theline memory as described above, with the contents of the primary linememory buffer transferred to the secondary buffer and output via the PHYwith a one row-interval latency as shown at 1231.

The multi-bank sample-and-hold implementation shown in FIG. 53 anddescribed in further detail below in reference to FIG. 55 becomes easierto understand in the context of FIG. 54A. More specifically, provisionof separate even-row and odd-row conditional read S/H banks makes itpossible to capture a signal-state sample of the full charge transferfrom photodetector to floating-diffusion within the conditional read S/Hbank for an odd pixel row (e.g., row i+1 as shown at SHS₂ pulse 1228)concurrently with ADC operations with respect to prior-row pixel sampleslatched within the even-row conditional read S/H bank, and vice-versa.Similarly, because the reset-state sample captured within a givenconditional read S/H bank is maintained for more than one row interval(i.e., to support Vt assessment as shown at 1225, and ADC operation at1229, provision of two reset-state S/H elements, ‘a’ and ‘b’, perconditional read S/H bank makes it possible to pipeline those operationswithout resource conflict. This can be seen by the alternating assertionof signals SHR_(1a) and SHR_(1b) for even row reset-state samples (e.g.,for samples i and i+2 as shown at 1209 and 1210) and, similarly, by thealternating assertion of signals SHR_(2a) and SHR_(2b) for odd rowreset-state samples. Further, because the Eclipse/Vt assessment may becompleted within a row interval, a single Eclipse/Vt S/H bank issufficient to support operations in all rows.

FIG. 55 illustrates an embodiment of multi-bank sample-and-hold circuit1081 that may be used to implement the sample-and-hold (S/H) circuitrydepicted in FIG. 52. As shown, the column read-out line for each of Kpixel columns (out₀, out₁, . . . , out_(K−1)) is supplied to arespective per-column S/H circuit 1251, each of which includes threesets of sample-and-hold elements (switch elements and storage elements)corresponding to the three sample-and-hold storage banks shown in FIG.53, namely, an eclipse/Vt assess bank, and separate even and oddconditional read banks (i.e., Conditional Read Bank 1 and ConditionalRead Bank 2). More specifically, as shown in detail view 1252, aper-column component of the eclipse/Vt assess bank 1255 includes twocapacitive storage elements, Cr_(comp), Cs_(comp), coupled via switchelements 1261 and 1263 to control lines SHR_(comp) and SHS_(comp),respectively. By this arrangement, when either of the SHR_(comp) orSHS_(comp) signals is pulsed (e.g., as shown in FIG. 54A), the floatingdiffusion state driven onto column read-out line, Out (e.g., by a sourcefollower transistor as described above), is captured within thecorresponding capacitive element.

Still referring to FIG. 55, even-row conditional read S/H bank component1257 includes a pair of reset-state capacitive elements, Cr_(1a) andCr_(1b), and corresponding switch elements 1265, 1267 (controlled bySHR_(1a) and SHR_(1b), respectively), and a signal-state capacitiveelement Cs₁ and corresponding switch element 1269 controlled by SHS₁.Odd row S/H bank component 1259 similarly includes reset-statecapacitive elements, Cr_(2a) and Cr_(2b), and corresponding switchelements controlled by SHR_(2a) and SHR_(2b), respectively, and asignal-state capacitive element, Cs₂, and corresponding switch elementcontrolled by SHS₂. As explained above, by providing separatereset-state capacitive elements within each conditional read S/H bank,it becomes possible to extend the interval for which a given reset-statesample is held (maintained) beyond two row intervals, and thus enablingpixel state assessment, conditional read/reset and selective ADCoperations to be pipelined. FIG. 56 illustrates an exemplary sample andhold pipeline corresponding generally to the S/H bank usage intervalswithin the timing arrangement of FIG. 54A.

FIG. 57 illustrates embodiments of a reference multiplexer 1277,comparator input multiplexer 1279 and comparator 1281 that may be usedto implement like-named components depicted in FIG. 52. In theembodiment shown, reference multiplexer 1277 sequences through selectionof three threshold references, including the eclipse, conditional-resetand saturation thresholds discussed above (ThreshE, ThreshR, ThreshS).As mentioned, additional thresholds may be provided and selected toaccount for variation in programmable gain, reset threshold and so forth(e.g., from subframe to subframe and/or according to imaging settings).The comparator input multiplexer 1279 includes a reset-state multiplexer1285 and signal-state multiplexer 1287, as well as asingle-ended/differential multiplexer 1289 that enables selectionbetween single-ended and differential outputs, the latter (i.e.,difference between signal-state and reference-state selections) beinggenerated by difference circuit 1288.

In one embodiment, the eclipse evaluation is carried out by supplyingCr_(comp) (i.e., the reset-state stored on capacitive element Cr_(comp)within the eclipse/Vt S/H bank) in single-ended form to comparator 1281for comparison with ThreshE, and the saturation assessment can besimilarly carried out by supplying Cs₁ or Cs₂ in single-ended form tocomparator 1281 for comparison with ThreshS. By contrast,conditional-reset comparison is effected by selecting the differentialbetween Cs_(comp) and Cr_(comp), and the saturation comparison byselecting the differential between Cs₁ and either of Cr_(1a) andCr_(1b), or Cs₂ and either of Cr_(2a) and Cr_(2b). In alternativeembodiments, any of the single-ended comparisons may be differential andvice-versa, in some cases simplifying the comparator input multiplexercircuitry (e.g., if no single-ended signals need be forwarded tocomparator 1281).

FIG. 58 illustrates embodiments of a column-shared programmable gainamplifier 1315 and K:1 ADC input multiplexer 1097 that may be deployedwithin the embodiment of FIG. 52. The ADC input mux includes a columnmultiplexer 1299 and a set of K source-select multiplexers 1297 thatcooperate to enable column-by-column delivery of one of foursignal-state/reset-state signal pairs (Cs₁/Cr_(1a), Cs₁/Cr_(1b),Cs₂/Cr_(2a) or Cs₂/Cr_(2b)) to the differential input ofprogrammable-gain amplifier 1315. By this arrangement, after read-enablebits have been recorded to reflect the pixel state assessment for eachof K columns, the source-select multiplexer can be set to select an evenrow or odd row input signal pair (e.g., alternating between Cs₁/Cr_(1a)and Cs₁/Cr_(1b) for every other even pixel row, and alternating betweenCs₂/Cr_(2a) and Cs₂/Cr_(2b) for every other odd pixel row) and the K:1column mux may be sequenced through the input sources from 0 to K−1 tosupport selective ADC operation.

In the embodiment shown, programmable gain amplifier 1315 includesmultiple stages of capacitively coupled differential amplifiers 1323,each of which applies a programmable gain according to the ratio of aninput capacitance 1319 and feedback-coupled variable capacitance 1321.In one implementation, shown in detail view 1322, variable capacitanceelement 1321 is implemented by switchably coupling a variable number ofcapacitive elements 1329 in parallel with a minimum capacitance 1327 inaccordance with a program setting. In one embodiment, switchably coupledcapacitive elements 1329 are binary-weighted (capacitances=x, 2x, 4x,8x, etc.) to enable 2^(R) different capacitance settings in accordancewith an R-bit control value. Alternatively, capacitive elements 1329 maybe thermometer coded, have matching capacitances or any otherarrangement that allows programmable gain amplifier to meet a desiredamplification range and resolution. Also, the programmable gainamplifier may be disabled by opening gain-stage switch elements 1317 inresponse to deassertion of a PGA enable signal (e.g., a signalequivalent to or derived from the RE bits recorded within line memory1050 and supplied via multiplexing element 1126 of FIG. 52). Also, anyof the gain stages (only two of which are shown) may be bypassedaccording to programmed gain settings to further extend theamplification range of programmable gain amplifier 1315. Note thatvarious other programmable gain amplifier implementations may be used inalternative embodiments, including PGA implementations that are enabledand disabled per the RE flag bit to save power.

FIG. 59A illustrates embodiments of a read-enable multiplexer 1341,ADC-enable logic 1343 and ADC circuit 1345 that may be used to implementthe K:1 read-enable multiplexer and ADC circuitry of FIG. 52. As shown,read-enable multiplexer 1341 is coupled to receive read-enable bits fromeach of K storage locations within primary line memory 1051 (i.e., eachlocation corresponding to a respective pixel column) and iterativelysequences through those locations to supply the read-enable bits, oneafter another, to the input of ADC-enable logic 1343 (i.e., an AND logicgate in the embodiment shown) and also to the column-shared PGA (wherethey may serve as or enable generation of the PGA-enable signaldescribed above). Referring to FIGS. 59A and 59B, a convert signal(“Convert”) is cycled K times per pixel row to advance the read-enablebit selection (e.g., by incrementing a counter that controls theread-enable multiplexer selection), with the selected read-enable bitgating application of the convert signal to an enable input of ADCcircuit 1345. By this operation, the high-state of the convert signaleither passes through or is blocked by logic gate 1343 according to thestate of the RE bit for that cycle of the convert signal, thereby eitherenabling or disabling operation of the PGA and ADC circuit according tothe state of the RE bit. The ADC result for each read-enabled pixelcolumn is stored within primary line memory buffer 1051 for eventualoutput to the VLL circuitry and PHY. Though not specifically shown, aset of “store” strobes that enable the output of ADC 1345 to be loadedinto respective line memory buffer locations may be asserted insuccession to enable successive (and selective) loading of ADC resultsinto primary line memory buffer 1051. Alternatively, the ADC results maybe loaded into a shift register and then transferred in parallel to theline memory buffer, masking or otherwise preventing buffer loadoperations for those pixel columns in which the RE bit is not set.

Read-Out Dilation

When a color filter array is applied in connection with the conditionalread/reset image sensors described above, image distortion may occurwhen a moving object triggers color-differentiated samplingoperations—conditional read/reset operations in a given subframe withinpixels for some colors, but not for adjacent pixels of other colors. Forexample, a moving object that triggers read-out operations in greenpixels (i.e., pixels that receive light predominantly in the greenwavelength band), but not adjacent red or blue pixels, may triggerrelatively rapid read/reset operations within the green pixels while theblue and red pixels are infrequently read (or read on differentsubframes than the adjacent green pixels), thus producing artifacts inthe finalized image. In a number of embodiments described below, suchchromatic distortion is mitigated by modifying the conditionalread/reset determination for a given pixel to account for the read/resetassessment for one or more neighboring pixels, in effect, expanding thenumber of pixels to be read/reset in response to an overthresholddetermination with respect to a given pixel; an approach referred toherein as “read-out dilation” or “read dilation.”

As a matter of terminology, pixels that form an interdependent group forpurposes of conditional read/reset are referred to as a “read kernel.”With some exceptions, discussed below, if one pixel within the readkernel exceeds the conditional read/reset threshold, all other pixelswithin the kernel are marked for read/reset, thus dilating the read-outregion to the entire kernel in a manner that prevents the chromaticdistortion described above. FIG. 60 illustrates an example of a 2×2 readkernel 1360, with the four pixels shown disposed beneath color filterelements disposed in a Bayer pattern, including a red element (R), blueelement (B) and two green elements (Gr and Gb, with the ‘r’ and ‘b’indicating the color of the same-row pixel within the kernel). In theexample shown, the green elements are determined to exceed theconditional read/reset threshold (i.e., overthreshold), triggeringread/reset operations in those pixels, with read-dilation circuitryacting to include the red and blue pixels in the read/reset operationsdespite the underthreshold status of those pixels.

FIG. 61 illustrates an exemplary read dilation flow diagram with respectto a read kernel, assuming for purposes of explanation that neighboringread kernels do not overlap (i.e., each pixel is in no more than oneread kernel). More detailed embodiments that enable overlapping readkernels are presented below with respect to FIGS. 62A/62B and 63A/63B.

Starting at 1371, a pixel index ‘i’ and dilation flag are initialized tozero. Following an integration interval, the partial-transfer result forpixel ‘i’ is sampled at 1373 and compared with the conditionalread/reset threshold. If pixel ‘i’ is overthreshold (affirmativedetermination at 1375), the read-enable flag for pixel ‘i’ is set at1377 and the dilation flag is also set at 1379. If the threshold testresult indicates an underthreshold condition (negative determination at1375), the read-enable flag for pixel ‘i’ is cleared at 1381. In eithercase (overthreshold or underthreshold), the dilation flag andread-enable flag are evaluated at 1383. If either flag is true (i.e.,logical ‘1’ in this example), a read/reset operation is executed withrespect to pixel T at 1385, followed by an increment operation at 1387to increment the pixel index and repeat the loop operations for the nextpixel in the kernel, concluding the kernel read-out operations if T hasexceeded the maximum index (i.e., affirmative determination at 1389).Returning to decision 1383, if neither the dilation flag nor theread-enable flag is true, the conditional read/reset operation isskipped, and loop index incremented to proceed to the next pixel in thekernel.

Reflecting on the operations shown in FIG. 61, it can be seen thatsetting the dilation flag at 1379 ensures that conditional read/resetoperations will be performed for all subsequent pixels in the kernel(i.e., pixels corresponding to indices greater than T), in effectoverriding the threshold test result for those pixels. Further, becauseonly a single loop iteration is carried out with respect to each pixelin the kernel and pixels are evaluated sequentially, read-dilationextends only to those pixels evaluated after the first pixel determinedto exceed the conditional read/reset threshold. In the read kernel ofFIG. 60, for example, assuming that pixels are implemented in a 2×2shared pixel architecture and are evaluated in the order {Gr, R, B, Gb}, if pixel R is the first overthreshold pixel (i.e., Gr isunderthreshold), read-dilation will extend only to pixels B and Gb, notto pixel Gr. Similarly, if pixel B is the first overthreshold pixel,read dilation will extend only to pixel B, with pixels Gr and R notbeing read or reset. In a number of embodiments, this prospectiveread-dilation effect has implications for desired pixel evaluationorder, with some pixels being evaluated in reverse column-order (i.e.,proceeding from higher to lower column index) to minimize thepossibility that a given color pixel will be systematically skipped fora given image capture. In other embodiments, pixel state assessment fora given row is recorded within the read-dilation logic for all pixelswithin the same row of a given read kernel before being written to linememory, thus enabling read-dilation to be extended to all such same-row,same-kernel pixels.

FIGS. 62A and 62B illustrate an exemplary set of 2×2 read kernels andcorresponding read-dilation flow diagram in an embodiment in which thebottom row of each read kernel overlaps the top row of the read kernelbelow. As a point of reference, the leftmost column of pixels in eachread kernel is referred to as the even pixel column and the rightmostcolumn of pixels as the odd pixel column. Also, pixels in each row areevaluated in parallel (concurrently) as in the embodiments of FIGS.52-59, and the pixels in each read kernel are disposed betweenBayer-patterned color elements as in FIG. 60.

FIG. 62A illustrates, within read kernels 1401, 1403, 1405 and 1407, thefour possible scenarios in which only one of four pixels (shaded)exceeds the conditional read/reset threshold. Assuming the row to rowprogression shown in FIG. 62B at 1415 (i.e., within adjacent columns of1×4 shared-readout pixel blocks), in all four single-pixel exceedancecases, read-dilation logic extends the conditional read/reset operationto all the pixels in the read kernel.

FIG. 62B presents an exemplary flow diagram of the read dilation logicapplied to realize the read kernel results in FIG. 62A. Starting at1421, a next-row flag (NextRowFlag) is reset in preparation for thestart of a scan through the pixel rows for a given subframe. At 1423 thenext-row flag is evaluated and, if set, triggers the operations shown at1425; setting read-enable flags for the even and odd pixel columns(RE-Even, RE-Odd) and clearing the next-row flag. If the next-row flagis found not to be set at 1423, then the read-enable flags for the evenand odd pixel columns are cleared at 1427.

Following the flag setting/clearing operations at 1425 or 1427, eclipseevaluations are performed in parallel for the even- and odd-columnpixels at 1429 e and 1429 o. In each case, if the pixel is determined tobe eclipsed, then the corresponding read-enable flag (i.e., RE-Even forthe even pixel, RE-Odd for the odd pixel) is cleared and the NextRowFlagis set at 1433 e/ 1433 o and the remaining tests and read are bypassed.Otherwise, for either of the pixels determined not to be eclipsed, aconditional-reset threshold test is performed and evaluated at 1431 e/1431 o, setting the next-row flag at 1433 if the conditional-resetthreshold is exceeded in either pixel.

Following the pixel assessment operations at 1429 e/ 1429 o and, ifnecessary, 1431 e/ 1431 o (and any flag setting/clearing operationsresulting therefrom), the read-enable flag is evaluated for each columnin conjunction with the next-row flag at 1435 e/ 1435 o. As shown, ifthe read-enable flag for a given column is set, or if the next-row flagis set, a read/reset operation is carried out with respect to that pixelat 1437 e/ 1437 o. Thus, even if only one of the even and odd pixels isuneclipsed and exceeds the conditional-reset threshold, setting of thenext-row flag at 1433 will result in a conditional read/reset operationbeing performed with respect to both pixels by virtue of the dilationlogic in operations 1435 e and 1435 o. Moreover, because the read-enableflags for both pixel columns are set at the start of a loop iteration(i.e., at 1423) upon determining that the next-row flag is set, the evenand odd pixels for a given row will be conditionally read and resetregardless of their respective pixel assessment results if the next-rowflag was set for the preceding row, thus extending the read dilationfrom an overthreshold non-eclipsed pixel in a given read kernel to itsneighbor in the row and to the two pixels below, as shown in the readkernels of FIG. 62A.

Continuing with the exemplary flow diagram of FIG. 62B, following aread/reset with respect to either pixel at 1437 e or 1437 o, theread-out value is compared with a saturation threshold in a saturationtest at 1439 e/ 1439 o. If the pixel is not saturated (read-out value isbelow saturation threshold, yielding an affirmative determination at1439 e/ 1439 o), the read-enable flag for the pixel is set at 1441 e/1441 o. Otherwise, the read-enable flag is cleared at 1443 e/ 1443 o.Following the detection of an eclipse at 1433 e/ 1433 o, or followingread-enable set or clear operations at 1441 e/ 1441 o or 1443 e/ 1443 o,or following a negative determination at 1435 e/ 1435 o (i.e., neitherread-enable flag nor next-row flag set and thus a determination tobypass pixel read/reset at 1437 e/ 1437 o), a line memory writeoperation is executed at 1445 to record the read-enable flag for boththe even and odd columns as a read-enable bit (i.e., for the even-columnpixel RE:=RE-Even, and for the odd-column pixel RE:=RE-Odd), and to setthe AB bit according to the pixel assessment results. Thereafter, theloop iteration is executed for the next row of pixels, carrying forwardthe affirmative state of the next-row flag if set in operation 1433(i.e., either of the even/odd pixels in the current row is non-eclipsedand exceeds the conditional read/reset threshold).

FIGS. 63A and 63B illustrate an exemplary set of 2×2 read kernels andcorresponding read-dilation flow diagram within an image sensorembodiment in which the bottom row of each read kernel overlaps the toprow of the read kernel below, but having 2×2 shared-readout pixel blocksinstead of the 1×4 shared-readout pixel blocks assumed in FIGS. 62A and62B. Because the pixels in each row of a given read-kernel share afloating diffusion (e.g., as described above in reference to FIGS. 16and 17), the pixel evaluation sequence progresses sequentially througheach pixel as shown at 1470 in FIG. 63B instead of column-parallel as inthe embodiment of 62B. Moreover, instead of a simple left-to-right pixelevaluation progression within each row, the “green” pixel in each row(i.e., pixel disposed beneath a green color element, Gr or Gb within theBayer color pattern shown) is evaluated first to maximize theopportunity to dilate the conditional read/reset to at least one pixelof each color. This optimization can be appreciated by considering eachof the possible single-threshold-exceedance scenarios shown in FIG. 63Ain the context of the pixel evaluation sequence shown at 1470 in FIG.63B. In the first read kernel (1461), pixel Gr is the sole overthresholdpixel, but also the first pixel evaluated, thus extending theconditional read/reset operation to the remaining three pixels (R, Gband B) despite their underthreshold condition. In the second read kernel(1463), the second evaluated pixel, pixel ‘R’, is the sole overthresholdpixel, but because pixel Gr was already determined to be underthresholdand not conditionally read/reset, the opportunity to extend theconditional read/reset to that pixel has passed (at least in anembodiment that refrains from regressive pixel evaluation).Consequently, though the overthreshold determination in pixel R resultsin read-dilation to the remaining pixels in the read kernel, the Grpixel remains unread, as indicated by its placement outside the boldboundary (which encompasses the pixel subset included in theread-dilation) and cross-hatching. Despite omission of the Gr pixel,however, the subsequent-row green pixel (Gb) is nevertheless includedwithin the read-dilation subset, thus ensuring that a pixel of eachcolor is read-out, thus mitigating chromatic distortion in the scenariodescribed above.

Continuing with FIG. 63A, if pixel Gb is the sole overthreshold pixel asin read kernel 1465, the reverse-direction pixel progression (i.e., fromright to left as shown in FIG. 63B at 1470) ensures that pixel B will beincluded in the read-dilation subset and thus that all the pixels in theread kernel will be conditionally read/reset. Considering thealternative case in which pixel progression proceeds from left to rightin each row (a possible embodiment); in that case pixel B would be readfirst, found to be underthreshold and therefore not conditionallyread/reset—omitted from the read-dilation subset as in the case of pixelGr above. In that case, the read-dilation pixel group would lack a bluepixel, making the sensor susceptible to chromatic distortion.

In the final read kernel 1467, pixel B is the sole overthreshold pixelwhich, due to the reverse (right to left) progression within the firstpixel row, excludes pixel Gb from the read-dilation subset. Because theread-dilation pixel subset will still include pixel Gr, however,read-out of at least one pixel from each color group is guaranteed.Thus, by sequencing through the pixels of each row in an order thatbegins with a pixel color that appears redundantly within the readkernel, a pixel of each color is guaranteed (or at least more likely) tobe included in the read-dilation pixel subset.

FIG. 63B presents an exemplary read-dilation flow diagram correspondingto the read kernels shown in FIG. 63A. Starting at 1471, two row flagsare reset (i.e., cleared), one for the current row within a given readkernel (“ThisRowFlag”) and one for the subsequent row (“NextRowFlag”).At 1473, an eclipse test is executed for the first pixel within a 2×2shared-readout pixel block. If the pixel is not eclipsed, a thresholdtest is executed at 1475 to determine if charge integrated within thepixel exceeds the conditional read/reset threshold (“Vt”). If overthreshold (“Over Vt”), the pixel is read/reset at 1481 and a saturationtest is performed at 1483 to determine whether the read-out sampleexceeds the saturation threshold. If the saturation threshold is notexceeded (i.e., pixel not saturated), the read-enable bit for the pixelis set in a line memory write operation at 1485 to enable a subsequentADC operation (the AB bit will be overwritten with the ADC result, andthus is shown as being written with a “don't care” value, ‘X’ in theline memory write operation) and the current row flag is evaluated at1487. If the current row flag is not set (negative determination at1487), then the current row flag and next row flag are set at 1489. Ifthe current row flag is determined to be set in branch point 1487 and ifthe pixel under evaluation was overthreshold (i.e., the subject pixeltriggered or would have triggered a read-dilation event), then thenext-row flag is set at 1491. At 1493, the pixel sequencing status isevaluated to determine whether the pixel under evaluation is the last ofthe two pixels to be evaluated within a given row of a 2×2 shared pixelblock (e.g., either pixel R or pixel B in the exemplary sequence shownat 1470). If so, then the next pixel to be evaluated will be in asubsequent row so that, at 1495, the logic state of the next row flag istransferred (assigned) to the current row flag and the next row flag isreset. If the pixel under evaluation is not the last of the two pixelsto be evaluated within a given shared pixel block row, the transfer andreset operations at 1495 are skipped.

Returning to the threshold test at 1475, if the pixel is determined tobe underthreshold (under Vt), then the current row flag is evaluated at1479 and, if clear (negative determination at 1479), a line memory writeis executed at 1499 to clear the read-enable bit for the current pixel(thus disabling ADC operation for that pixel) and clear the AB bit toreflect the underthreshold condition. By contrast, if the current rowflag is determined to be set at 1479, a conditional read/reset isexecuted at 1481, despite the underthreshold status of the pixel, thuseffecting a read dilation. Because any overthreshold determination withrespect to a pixel within the current row or previous row will ensureexecution of a read/reset operation at 1481 for all non-eclipsed pixelsyet to be evaluated within a given read kernel (i.e., by virtue anaffirmative determination at 1479 if the subject pixel is not itselfoverthreshold), read dilation extends to all pixels within the readkernel following identification of an overthreshold pixel, thuseffecting the read kernel patterns shown in FIG. 63A. Determination thata given pixel is saturated (i.e., affirmative determination at 1483)clears the RE bit in the line memory write at 1499 and sets the AB bitto reflect the saturation result (i.e., AB=1). In the embodiment of FIG.63B, the saturation determination also results in skipping theconditional flag setting operations at 1489 and 1491. In alternativeembodiments, a saturated pixel may result in setting flags at 1489 or1491, despite disabling ADC operation for the subject pixel. Similarly,while an eclipse determination at 1473 results in bypassing thethreshold testing operation at 1475 (proceeding straight to pixel resetat 1497; an operation which may be effected by a conditional read/resetoperation as discussed above), clearing the RE bit and setting the ABbit at 1499 (i.e., to reflect the eclipsed condition), and thenbypassing the conditional flag setting operations at 1489 and 1491, aneclipsed pixel may alternatively result in setting flags at 1489 or1491, despite disabling the ADC operation.

FIG. 64 illustrates an exemplary K-column section of an image sensor1510 having logic to carry out read-dilation operations as illustratedin FIGS. 62A/62B and 63A/63B. In the arrangement shown, the pixel array1011, multi-bank sample-and-hold circuitry 1081, column-shared PGA 1083,column-shared ADC circuitry 1130, multiplexing circuits 1126 and 1127,and line memory buffers 1050 are implemented generally as described inreference to FIGS. 52-59. Comparator circuitry 1511 is also implementedgenerally as described in reference to FIGS. 52 and 57, except that theper-column read-enable logic (element 1125 of FIG. 52) is replaced bymulti-column read-enable/dilation logic 1515 coupled to receive theoutput of the comparators for multiple adjacent columns corresponding topixels within the same read kernel (two adjacent columns and thuscolumns 1/2, 3/4 , . . ., K−1/K, in the embodiment shown). By thisarrangement, the read-enable bit determination for a given pixel may bebased on the pixel assessment results and corresponding row flags formultiple column-adjacent and row-adjacent pixels within a read kernel asdescribed in reference to FIGS. 62A/62B and 63A/63B.

In embodiments that allow interleaved operation between two or moresubexposures, RE/Dilate Logic 1515 is designed to save dilation statewhen switching row context from one subexposure to another. Forinstance, if four subexposure scans are interleaved, logic 1515 retainsfour separate dilation states. When dilation state for a row x iscomplete, it is retained in an indexed set of registers while, e.g.,dilation state for up to three unrelated rows is accessed for the nextthree row operations. On the fourth successive row operation, whichvisits row (x+1), the row x state is referenced to determine whetherdilation requires pixel reads due to overthreshold state at row x.

Dilation may be neither necessary nor desirable in all modes ofoperation. Thus preferably, logic 1515 has at least one dilate mode andat least one non-dilate mode (where every pixel is evaluated for readoutcompletely independent of surrounding pixels). In some embodiments,dilation can also be activated on a subframe basis. For instance, onlythe longest subexposure(s) may use dilation, as that is where motionartifacts would be more apparent and/or problematic. Dilation logic 1515would in such case, when interleaving is used, allow state storage foreach subexposure that indicates whether or not dilation applies eachtime a row is visited for that subexposure.

When received within a computer system via one or more computer-readablemedia, such data and/or instruction-based expressions of the abovedescribed circuits can be processed by a processing entity (e.g., one ormore processors) within the computer system in conjunction withexecution of one or more other computer programs including, withoutlimitation, net-list generation programs, place and route programs andthe like, to generate a representation or image of a physicalmanifestation of such circuits. Such representation or image canthereafter be used in device fabrication, for example, by enablinggeneration of one or more masks that are used to form various componentsof the circuits in a device fabrication process.

In the foregoing description and in the accompanying drawings, specificterminology and drawing symbols have been set forth to provide athorough understanding of the disclosed embodiments. In some instances,the terminology and symbols may imply specific details that are notrequired to practice those embodiments. For example, any of the specificnumbers of bits, signal path widths, signaling or operating frequencies,component circuits or devices and the like can be different from thosedescribed above in alternative embodiments. Additionally, links or otherinterconnection between integrated circuit devices or internal circuitelements or blocks may be shown as buses or as single signal lines. Eachof the buses can alternatively be a single signal line, and each of thesingle signal lines can alternatively be buses. Signals and signalinglinks, however shown or described, can be single-ended or differential.A signal driving circuit is said to “output” a signal to a signalreceiving circuit when the signal driving circuit asserts (orde-asserts, if explicitly stated or indicated by context) the signal ona signal line coupled between the signal driving and signal receivingcircuits. The term “coupled” is used herein to express a directconnection as well as a connection through one or more interveningcircuits or structures. Integrated circuit device “programming” caninclude, for example and without limitation, loading a control valueinto a register or other storage circuit within the integrated circuitdevice in response to a host instruction (and thus controlling anoperational aspect of the device and/or establishing a deviceconfiguration) or through a one-time programming operation (e.g.,blowing fuses within a configuration circuit during device production),and/or connecting one or more selected pins or other contact structuresof the device to reference voltage lines (also referred to as strapping)to establish a particular device configuration or operation aspect ofthe device. The term “light” as used to apply to radiation is notlimited to visible light, and when used to describe sensor function isintended to apply to the wavelength band or bands to which a particularpixel construction (including any corresponding filters) is sensitive.The terms “exemplary” and “embodiment” are used to express an example,not a preference or requirement. Also, the terms “may” and “can” areused interchangeably to denote optional (permissible) subject matter.The absence of either term should not be construed as meaning that agiven feature or technique is required.

The section headings in the above detailed description have beenprovided for convenience of reference only and in no way define, limit,construe or describe the scope or extent of the corresponding sectionsor any of the embodiments presented herein. Also, various modificationsand changes can be made to the embodiments presented herein withoutdeparting from the broader spirit and scope of the disclosure. Forexample, features or aspects of any of the embodiments can be applied,at least where practicable, in combination with any other of theembodiments or in place of counterpart features or aspects thereof.Accordingly, the specification and drawings are to be regarded in anillustrative rather than a restrictive sense.

What is claimed is:
 1. An integrated-circuit image sensor comprising: apixel array having a plurality of pixels disposed in rows and columns; aplurality of pixel read-out lines coupled to respective columns of thepixels; a plurality of comparator circuits each coupled to a respectiveone of the pixel read-out lines; an analog-to-digital converter (ADC)circuit; and a first multiplexing circuit having inputs coupledrespectively to the pixel read-out lines and an output coupled to aninput of the ADC circuit.
 2. The integrated-circuit image sensor ofclaim 1 wherein each of the plurality of comparator circuits comprises(i) a first input to receive a respective pixel read-out signal from aselected pixel within the column of pixels to which the respective pixelread-out line is coupled and (ii) a second input, and wherein theintegrated-circuit image sensor further comprises a second multiplexingcircuit having inputs coupled to respective reference voltage lines andan output coupled to the second input of at least one of the comparatorcircuits.
 3. The integrated-circuit image sensor of claim 2 wherein thereference voltage lines comprise a first reference voltage line toconvey a saturation threshold voltage and a second reference voltageline to convey an eclipse threshold voltage, the saturation thresholdvoltage corresponding to a pixel read-out signal level indicative ofphoto-well saturation within the selected pixel and the eclipsethreshold voltage corresponding to a pixel read-out signal levelindicative of an eclipse event within the selected pixel.
 4. Theintegrated-circuit image sensor of claim 1 wherein each one of theplurality of comparator circuits comprises (i) a first input to receivea respective pixel read-out signal from a selected pixel within thecolumn of pixels to which the respective pixel read-out line is coupled,(ii) a second input to receive a selected threshold level, and (iii)circuitry to generate a comparator-result signal that indicates whetherthe pixel read-out signal from the selected pixel exceeds the selectedthreshold level, and wherein the integrated-circuit image sensor furthercomprises circuitry to selectively disable operation of the ADC circuitwith respect to the pixel read-out signal based at least in part on thecomparator-result signal.
 5. The integrated-circuit image sensor ofclaim 4 wherein the circuitry to generate the comparator-result signalthat indicates whether the pixel read-out signal exceeds the selectedthreshold level comprises circuitry to indicate that the pixel read-outsignal exceeds the selected threshold level in response to detecting apixel read-out signal voltage lower than a voltage indicated by theselected threshold level.
 6. The integrated-circuit image sensor ofclaim 1 wherein the first multiplexing circuit comprises (i) circuitryto switchably couple a selected one of the pixel read-out lines to theADC circuit and (ii) a control input to receive a control signal thatspecifies the selected one of the pixel read-out lines.
 7. Theintegrated-circuit image sensor of claim 6 further comprising controlcircuitry that sequences the control signal to select each of the pixelread-out lines to be the selected one of the pixel read-out lines duringa respective time interval.
 8. The integrated-circuit image sensor ofclaim 7 where in the control circuitry repeatedly steps the controlsignal through a pattern of values to iteratively select each of thepixel read-out lines.
 9. The integrated-circuit image sensor of claim 1further comprising a buffer memory and a second multiplexing circuitcoupled between the buffer memory and an output of the ADC circuit, thesecond multiplexing circuit comprising circuitry to switchably route asequence of digital pixel values generated by the ADC circuit torespective storage locations within the buffer memory, each of thedigital pixel values constituting a digital representation of a pixelread-out signal conveyed on a respective one of the pixel read-outlines.
 10. The integrated-circuit image sensor of claim 1 wherein theADC circuit comprises a successive approximation register ADC circuit.11. The integrated-circuit image sensor of claim 10 further comprising asecond multiplexing circuit to supply a sequence of reference voltagesto the successive approximation register ADC circuit to be appliedtherein in performance of a successive-approximation analog-to-digitalconversion operation.
 12. A method of operation within anintegrated-circuit image sensor having a pixel array, the methodcomprising: generating respective read-out signals on a plurality ofcolumn read-out lines coupled to respective columns of pixels within thepixel array; comparing the read-out signals with at least one referencethreshold within respective comparator circuits coupled respectively tothe column read-out lines; and switchably coupling each of the columnread-out lines to an analog-to-digital converter (ADC) circuit to route,at respective times, each of the read-out signals to the ADC circuit.13. The method of claim 12 further comprising switchably coupling asequence of reference thresholds to the comparator circuits to becompared with the read-out signals, the sequence of reference thresholdsincluding the at least one reference threshold and at least one otherreference threshold.
 14. The method of claim 13 wherein the at least onereference threshold comprises a saturation threshold voltagecorresponding to a pixel read-out signal level indicative of photo-wellsaturation within a selected pixel, and wherein the at least one otherreference threshold comprises an eclipse threshold voltage correspondingto a pixel read-out signal level indicative of an eclipse event withinthe selected pixel.
 15. The method of claim 12 further comprisingselectively enabling the ADC circuit to generate a digitalrepresentation of each one of the read-out signals based at least inpart on a comparison-result signal generated by a respective one of thecomparator circuits, the comparison-result signal indicating whether theone of the read-out signals exceeds the at least one referencethreshold.
 16. The method of claim 15 wherein the comparison-resultsignal indicates that the one of the read-out signals exceeds the atleast one reference threshold if the one of the read-out signals has avoltage level lower than a voltage level of the at least one referencethreshold.
 17. The method of claim 12 further comprising switchablyrouting a sequence of digital pixel values generated by the ADC circuitto respective storage locations within a buffer memory, the digitalpixel values constituting respective digital representations of theread-out signals.
 18. The method of claim 12 further comprisingperforming a sequence of analog-to-digital conversions within the ADCcircuit to generate digital representations of the read-out signals. 19.The method of claim 18 wherein performing the sequence ofanalog-to-digital conversions comprises performing asuccessive-approximation analog-to-digital conversion of each of theread-out signals during a respective time interval.
 20. Anintegrated-circuit image sensor comprising: a pixel array; a pluralityof comparator circuits; an analog-to-digital converter (ADC) circuit;means for generating respective read-out signals on a plurality ofcolumn read-out lines coupled to respective columns of pixels within thepixel array; means for comparing each of the read-out signals with atleast one reference threshold within a respective one of the comparatorcircuits; and means for switchably coupling each of the column read-outlines to the ADC circuit to route, at respective times, each of theread-out signals to the ADC circuit for analog-to-digital conversion.